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D. J. S. Findlay

Publications and source records attributed to D. J. S. Findlay.

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Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.

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