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Antonino Miceli

Publications and source records attributed to Antonino Miceli.

At least 19 recordsLinked to original sources

Discrete Wavelet Transform for Serial X-ray Crystallography Image Segmentation

Upcoming LCLS-II/II-HE operation at repetition rates approaching 1MHz demands on-detector data reduction to manage the resulting data volumes. We present a 2D discrete wavelet transform (DWT) pre-processing algorithm that segments background scatter from crystal diffraction in serial crystallography images, enabling early data analysis and, when combined with peak finding, lossy compression by transmitting only the identified diffraction peaks. The method zeroes the approximation (LL) coefficients of a multi-level Haar wavelet decomposition and reconstructs from detail subbands only, exploiting the natural separation of smooth background and sharp Bragg peaks in the wavelet domain. Evaluated on 100 simulated nanoBragg frames with known ground truth, the pipeline achieves $F1 \approx 0.96$ at four decomposition levels ($J = 4$), substantially outperforming the established peakfinder8 algorithm ($F1 \approx 0.37$) in both precision ($P \approx 1.00$ vs.\ $0.94$) and recall ($R \approx 0.92$ vs.\ $0.24$). A comparison of 12 wavelet families confirms that Haar is optimal for Bragg-peak detection due to its minimal filter support. Downstream crystallographic analysis performed on real ePix10kA data shows that CC* and $R_\mathrm{split}$ converge at $J = 4$ and track the unprocessed baseline through the practical resolution limit. Under added noise exceeding $\sim$50 ADU, the current pipeline's precision degrades significantly more than that of the pf8 algorithm, exposing a limitation of the proposed strategy. We also demonstrate an FPGA implementation of the DWT filters on an Alveo U200 at 200MHz, with a projected resource footprint compatible with integration into the upcoming ePixUHR firmware and a path to on-detector ASIC implementation in SparkPix detector family.

physics.ins-det

HeteroViT: A Versatile Single-Layer Vision Transformer Concept, Co-Designed for Distributed Real-Time Data Reduction on Scientific Detectors

Next-generation X-ray detectors generate data faster than any system can affordably store or process. LCLS-II, the upgraded Linac Coherent Light Source at SLAC, produces data on the order of terabytes per second, with raw-data transfer and storage projected to be prohibitively costly, even though much of the data is not scientifically useful. This concept paper focuses on two major points. The first is versatility: a deliberately tiny, single-layer Vision Transformer (ViT) is enough to serve distinct scientific quick-evaluation tasks. We demonstrate this on two very different problems: (a) a supervised hit/miss/maybe classification on the CSPAD dataset, made to resemble ePixUHR-like detector frames, and (b) a self-supervised latent space for rare-event detection in X-ray diffraction spanning two learning paradigms, two output types, and two detector modalities, with one small backbone. The second is hardware co-design: because the ViT's blocks are structurally uniform, the model maps cleanly onto the heterogeneous hardware already present in the LCLS detector pipeline (ASIC -> FPGA -> GPU) under a simple rule one ASIC is one token so the data is reduced progressively at each stage and a keep/discard decision is produced in real time at the edge. The two claims reinforce each other: versatility is precisely what justifies freezing the front-end in silicon, since a reusable front-end is only worth committing to hardware if it serves many tasks. We are explicit that this is a concept supported by early software analysis, not a hardware demonstration. The natural and primary next phase is the hardware implementation of this distributed pipeline. The decisive evidence still owed an end-to-end latency budget, ASIC feasibility of the in-sensor embedding, and the false-negative behavior that matters for a data veto defines that program. HeteroViT is our first step toward it.

physics.ins-det

Unsupervised Semantic Segmentation in Synchrotron Computed Tomography with Self-Correcting Pseudo Labels

X-ray computed tomography (CT) is a widely used imaging technique that provides detailed examinations into the internal structure of an object with synchrotron CT (SR-CT) enabling improved data quality by using higher energy, monochromatic X-rays. While SR-CT allows for improved resolution, time-resolved experimentation, and reduced imaging artifacts, it also produces significantly larger datasets than conventional CT. Accurate and efficient evaluation of these datasets is a critical component of these workflows; yet is often done manually representing a major bottleneck in the analysis phase. While deep learning has emerged as a powerful tool capable of providing a wide range of purely data-driven solutions, it requires a substantial amount of labeled data for training and manual annotation of SR-CT datasets is impractical in practice. In this paper, we introduce a novel framework that enables automatic segmentation of large, high-resolution SR-CT datasets by eliminating the need to hand label images for deep learning training. First, we generate pseudo labels by clustering on the voxel values identifying regions in the volume with similar attenuation coefficients producing an initial semantic map. Afterwards, we train a segmentation model on the pseudo labels before utilizing the Unbiased Teacher approach to self-correct them ensuring accurate final segmentations. We find our approach improves pixel-wise accuracy and mIoU by 13.31% and 15.94%, respectively, over the baseline pseudo labels when using a magnesium crystal SR-CT sample. Additionally, we extensively evaluate the different components of our workflow including segmentation model, loss function, pseudo labeling strategy, and input type. Finally, we evaluate our approach on to two additional samples highlighting our frameworks ability to produce segmentations that are considerably better than the original pseudo labels.

cs.CV

A 28nm Multiply-Accumulate ASIC Architecture for On-Chip Data Compression in MHz Frame Rate X-ray and Electron Pixel Detectors

Modern X-ray detector systems urgently require compact, efficient, and fast data compression schemes to handle the transmission of big data from pixel arrays, enabling frame rates in the MHz regime. In this work, a data compression ASIC that implements a streaming fixed-length lossy compression scheme is introduced and analyzed, proving the feasibility and benefits of on-chip compression. The compression scheme utilizes a vector matrix product logic, which performs a number of floating-point multiplications, additions, and accumulations. The logic is verified, synthesized, and shown to fit in the area resource available for the X-ray detector under study, which comprises 192 x 168 pixels each of 12-bit width, and having a total area of 20 mm x 20 mm, about 2 mm x 20 mm of which are available for the digital logic. Several system architectures, precisions, and compression ratios ranging from 100 to 250 were analyzed to pave the way for on-chip fixed-length compression (e.g., principal component analysis, singular value decomposition) and data reduction (e.g., azimuthal integration) for X-ray and electron detectors.

physics.ins-det

Controlled Shifts of X-ray Emission Lines Measured with Transition Edge Sensors at the Advanced Photon Source

The measurement of shifts in the energy of X-ray emission lines is important for understanding the electronic structure and physical properties of materials. In this study, we demonstrate a method using a synchrotron source to introduce controlled eV-scale shifts of a narrow line in between fixed-energy fluorescence lines. We use this to characterize the ability of a hard X-ray superconducting Transition Edge Sensor (TES) array to measure line shifts. Fixed fluorescence lines excited by higher harmonics of the monochromatic X-ray beam are used for online energy calibration, while elastic scattering from the primary harmonic acts as the variable energy emission line under study. We use this method to demonstrate the ability to track shifts in the energy of the elastic scattering line of magnitude smaller than the TES energy resolution, and find we are ultimately limited by our calibration procedure. The method can be applied over a wide X-ray energy range and provides a robust approach for the characterization of the ability of high-resolution detectors to detect X-ray emission line shifts, and the quantitative comparison of energy calibration procedures.

physics.ins-det

A high-speed, high-resolution Transition Edge Sensor spectrometer for soft X-rays at the Advanced Photon Source

This project explores the design and development of a transition edge sensor (TES) spectrometer for resonant soft X- ray scattering (RSXS) measurements developed in collaboration between Argonne National Laboratory (ANL) and the National Institute of Standards and Technology (NIST). Soft X-ray scattering is a powerful technique for studying the electronic and magnetic properties of materials on a microscopic level. However, the lack of high-performance soft X-ray spectrometers has limited the potential of this technique. TES spectrometers have the potential to overcome these limitations due to their high energy resolution, high efficiency, and broad energy range. This project aims to optimize the design of a TES spectrometer for RSXS measurements and more generally soft X-ray spectroscopy at the Advanced Photon Source (APS) 29-ID, leading to improved understanding of advanced materials. We will present a detailed description of the instrument design and implementation. The spectrometer consists of a large array of approximately 250 high-speed and high-resolution pixels. The pixels have saturation energies of approximately 1 keV, sub-ms pulse duration and energy resolution of approximately 1 eV. The array is read out using microwave multiplexing chips with MHz bandwidth per channel, enabling efficient data throughput. To facilitate measurement of samples in situ under ultra-high vacuum conditions at the beamline, the spectrometer is integrated with an approximately 1 m long snout.

physics.ins-det

Temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth films for X- ray transition-edge sensor absorbers

This study investigates the temperature-induced hysteretic behavior of resistivity and magnetoresistance in electrodeposited bismuth films, with a focus on their application as absorbers in transition-edge sensors (TESs) for X-ray detection. Through a series of resistance versus temperature measurements from room temperature to a few Kelvins, we explore the change in the conductive behavior of bismuth electrodeposited on various substrates at the various temperatures. Our findings show for the first time both hysteretic and irreversible changes in resistivity as a function of temperature. Further, magnetoresistance measurements reveal notable variations in resistance behavior under different magnetic fields, highlighting the impact of magnetic fields on these films' electronic transport properties, with an indication of potential weak anti-localization effects at the lowest temperatures. This study not only provides a deeper understanding of bismuth's conductivity characteristics at low temperatures but also sheds light on the practical implications for developing more effective TESs for synchrotron X-ray facilities.

physics.ins-det

Homomorphic data compression for real time photon correlation analysis

The construction of highly coherent x-ray sources has enabled new research opportunities across the scientific landscape. The maximum raw data rate per beamline now exceeds 40 GB/s, posing unprecedented challenges for the online processing and offline storage of the big data. Such challenge is particularly prominent for x-ray photon correlation spectroscopy (XPCS), where real time analyses require simultaneous calculation on all the previously acquired data in the time series. We present a homomorphic compression scheme to effectively reduce the computational time and memory space required for XPCS analysis. Leveraging similarities in the mathematical expression between a matrix-based compression algorithm and the correlation calculation, our approach allows direct operation on the compressed data without their decompression. The lossy compression reduces the computational time by a factor of 10,000, enabling real time calculation of the correlation functions at kHz framerate. Our demonstration of a homomorphic compression of scientific data provides an effective solution to the big data challenge at coherent light sources. Beyond the example shown in this work, the framework can be extended to facilitate real-time operations directly on a compressed data stream for other techniques.

math.NA

Signatures of Thermal and Electrical Crosstalk in a Microwave Multiplexed Hard X-ray Transition Edge Sensor Array

We investigate the crosstalk between Transition-Edge Sensor (TES) pixels in a prototype 24-pixel hard X-ray array fabricated at the Advanced Photon Source, Argonne National Laboratory. Analysis shows thermal cross talk, possibly associated with insufficient thermalization, and rare but large in magnitude electrical crosstalk between specific perpetrator-victim pixel combinations, potentially due to deficiencies in the bias wiring or microwave multiplexing circuit. We use a method based on group triggering and averaging to isolate the crosstalk response despite only having access to X-ray photon illumination uniform across the entire array. This allows us to identify thermal and electrical crosstalk between pixel pairs in repeated measurements to the level of 1 part in 1000 or better. In the array under study, the magnitude of observed crosstalk is small but comparable to the resolving power of this pixel design (E/$Δ$E $\sim$ 1000 at 20 keV) and so potentially responsible for a degradation in energy resolution of the array at high incident photon rates. Having proven the methods to identify and quantify crosstalk in our setup, we can consider mitigations.

physics.ins-det

Rapid detection of rare events from in situ X-ray diffraction data using machine learning

High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli such as thermo-mechanical loading to take snapshots over time of the evolving microstructure and attributes. However, the extreme data volumes and the high costs of traditional data acquisition and reduction approaches pose a barrier to quickly extracting actionable insights and improving the temporal resolution of these snapshots. Here we present a fully automated technique capable of rapidly detecting the onset of plasticity in high-energy X-ray microscopy data. Our technique is computationally faster by at least 50 times than the traditional approaches and works for data sets that are up to 9 times sparser than a full data set. This new technique leverages self-supervised image representation learning and clustering to transform massive data into compact, semantic-rich representations of visually salient characteristics (e.g., peak shapes). These characteristics can be a rapid indicator of anomalous events such as changes in diffraction peak shapes. We anticipate that this technique will provide just-in-time actionable information to drive smarter experiments that effectively deploy multi-modal X-ray diffraction methods that span many decades of length scales.

cs.LG

AI-assisted Automated Workflow for Real-time X-ray Ptychography Data Analysis via Federated Resources

We present an end-to-end automated workflow that uses large-scale remote compute resources and an embedded GPU platform at the edge to enable AI/ML-accelerated real-time analysis of data collected for x-ray ptychography. Ptychography is a lensless method that is being used to image samples through a simultaneous numerical inversion of a large number of diffraction patterns from adjacent overlapping scan positions. This acquisition method can enable nanoscale imaging with x-rays and electrons, but this often requires very large experimental datasets and commensurately high turnaround times, which can limit experimental capabilities such as real-time experimental steering and low-latency monitoring. In this work, we introduce a software system that can automate ptychography data analysis tasks. We accelerate the data analysis pipeline by using a modified version of PtychoNN -- an ML-based approach to solve phase retrieval problem that shows two orders of magnitude speedup compared to traditional iterative methods. Further, our system coordinates and overlaps different data analysis tasks to minimize synchronization overhead between different stages of the workflow. We evaluate our workflow system with real-world experimental workloads from the 26ID beamline at Advanced Photon Source and ThetaGPU cluster at Argonne Leadership Computing Resources.

cs.CV

Demonstration of an AI-driven workflow for autonomous high-resolution scanning microscopy

With the continuing advances in scientific instrumentation, scanning microscopes are now able to image physical systems with up to sub-atomic-level spatial resolutions and sub-picosecond time resolutions. Commensurately, they are generating ever-increasing volumes of data, storing and analysis of which is becoming an increasingly difficult prospect. One approach to address this challenge is through self-driving experimentation techniques that can actively analyze the data being collected and use this information to make on-the-fly measurement choices, such that the data collected is sparse but representative of the sample and sufficiently informative. Here, we report the Fast Autonomous Scanning Toolkit (FAST) that combines a trained neural network, a route optimization technique, and efficient hardware control methods to enable a self-driving scanning microscopy experiment. The key features of our method are that: it does not require any prior information about the sample, it has a very low computational cost, and that it uses generic hardware controls with minimal experiment-specific wrapping. We test this toolkit in numerical experiments and a scanning dark-field x-ray microscopy experiment of a $WSe_2$ thin film, where our experiments show that a FAST scan of <25% of the sample is sufficient to produce both a high-fidelity image and a quantitative analysis of the surface distortions in the sample. We show that FAST can autonomously identify all features of interest in the sample while significantly reducing the scan time, the volume of data acquired, and dose on the sample. The FAST toolkit is easy to apply for any scanning microscopy modalities and we anticipate adoption of this technique will empower broader multi-level studies of the evolution of physical phenomena with respect to time, temperature, or other experimental parameters.

physics.app-ph

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.

physics.ins-det

Deep learning at the edge enables real-time streaming ptychographic imaging

Coherent microscopy techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of brighter sources and high-rate detectors, coherent X-ray microscopy methods like ptychography are poised to revolutionize nanoscale materials characterization. However, associated significant increases in data and compute needs mean that conventional approaches no longer suffice for recovering sample images in real-time from high-speed coherent imaging experiments. Here, we demonstrate a workflow that leverages artificial intelligence at the edge and high-performance computing to enable real-time inversion on X-ray ptychography data streamed directly from a detector at up to 2 kHz. The proposed AI-enabled workflow eliminates the sampling constraints imposed by traditional ptychography, allowing low dose imaging using orders of magnitude less data than required by traditional methods.

cs.LG

fairDMS: Rapid Model Training by Data and Model Reuse

Extracting actionable information rapidly from data produced by instruments such as the Linac Coherent Light Source (LCLS-II) and Advanced Photon Source Upgrade (APS-U) is becoming ever more challenging due to high (up to TB/s) data rates. Conventional physics-based information retrieval methods are hard-pressed to detect interesting events fast enough to enable timely focusing on a rare event or correction of an error. Machine learning~(ML) methods that learn cheap surrogate classifiers present a promising alternative, but can fail catastrophically when changes in instrument or sample result in degradation in ML performance. To overcome such difficulties, we present a new data storage and ML model training architecture designed to organize large volumes of data and models so that when model degradation is detected, prior models and/or data can be queried rapidly and a more suitable model retrieved and fine-tuned for new conditions. We show that our approach can achieve up to 100x data labelling speedup compared to the current state-of-the-art, 200x improvement in training speed, and 92x speedup in-terms of end-to-end model updating time.

cs.LG

A lightweight, user-configurable detector ASIC digital architecture with on-chip data compression for MHz X-ray coherent diffraction imaging

Today, most X-ray pixel detectors used at light sources transmit raw pixel data off the detector ASIC. With the availability of more advanced ASIC technology nodes for scientific application, more digital functionality from the computing domains (e.g., compression) can be integrated directly into a detector ASIC to increase data velocity. In this paper, we describe a lightweight, user-configurable detector ASIC digital architecture with on-chip compression which can be implemented in \SI{130}{\nm} technologies in a reasonable area on the ASIC periphery. In addition, we present a design to efficiently handle the variable data from the stream of parallel compressors. The architecture includes user-selectable lossy and lossless compression blocks. The impact of lossy compression algorithms is evaluated on simulated and experimental X-ray ptychography datasets. This architecture is a practical approach to increase pixel detector frame rates towards the continuous \SI{1}{\MHz} regime for not only coherent imaging techniques such as ptychography, but also for other diffraction techniques at X-ray light sources.

physics.ins-det

Absolute Energy Measurements with Superconducting Transition-Edge Sensors for Muonic X-ray Spectroscopy at 44 keV

Superconducting transition-edge sensor (TES) microcalorimeters have great utility in x-ray applications owing to their high energy resolution, good collecting efficiency and the feasibility of being multiplexed into large arrays. In this work, we develop hard x-ray TESs to measure the absolute energies of muonic-argon ($μ$-Ar) transition lines around 44 keV and 20 keV. TESs with sidecar absorbers of different heat capacities were fabricated and characterized for their energy resolution and calibration uncertainty. We achieved ~ 1 eV absolute energy measurement accuracy at 44 keV, and < 12 eV energy resolution at 17.5 keV.

physics.ins-det

Pushing compute and AI onto detector silicon

In order to take full advantage of the U.S. Department of Energy's billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology but also in computing and specifically AI. Let us consider an example from X-ray science. Nanoscale X-ray imaging is a crucial tool to enable a wide range of scientific explorations from materials science and biology to mechanical and civil engineering. The next-generation light sources will increase the X-ray beam brightness and coherent flux by 100 to 1,000 times. In order to image larger samples, the continuous frame rate of pixel array detectors must be increased, approaching 1 MHz, which requires several Tbps (aggregated) to transfer pixel data out to a data acquisition system. Using 65-nm CMOS technology, an optimistic raw data rate off such a chip is about 100-200 Gbps. However, a continuous 1 MHz detector with only $256 \times 256$ pixels at 16-bit resolution, for example, will require 1,000 Gbps (i.e., 1 Tbps) bandwidth off the chip! It is impractical to have multiple high-speed transceivers running in parallel to provide such bandwidth and represents the first data bottleneck. New approaches are necessary to reduce the data size by performing data compression or AI-based feature extraction directly inside a detector silicon chip in a streaming manner before sending it off-chip.

physics.ins-det