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Benjamin Laudert

Publications and source records attributed to Benjamin Laudert.

6 recordsLinked to original sources

Demonstration of a Monolithic and Fully Telecom-Fiber-Compatible Tunable Source of Polarization Entangled Photon Pairs Based on a van der Waals Material

We present a tunable, single-mode-optical-fiber-based source of polarization entangled photon pairs for the near-infrared telecommunication band that is deployable in standard infrastructure. The photon pairs are generated via spontaneous parametric down-conversion (SPDC) in a submicron-scale thin film of the inversion-broken rhombohedral polytype of the transition metal dichalcogenide molybdenum disulfide (3R-MoS$_2$), located between two fiber connectors. By exploiting the intrinsic symmetries of the second-order nonlinear susceptibility tensor of 3R-MoS$_2$, this hybrid approach offers control over the generated two-photon polarization state through the incident pump polarization. Most notably, two of the four maximally entangled Bell states, as well as fully co-polarized pairs can be produced. This represents a substantial improvement in terms of tunability and simplicity over established fiber-integrated sources, which require additional optical elements, precise alignment, or careful engineering of design parameters. Additionally, a nonlinear drop in the background photoluminescence signal of 3R-MoS$_2$ is observed at low pump powers, allowing us to reach a coincidences-to-accidentals ratio (CAR) of $(8.3\pm1.8)\times10^{3}$, the highest value recorded for SPDC in van der Waals materials to date.

quant-ph

Sparse Spectral Imaging for Thickness Mapping of 3R-MoS$_2$ on PDMS

We present a non-destructive, spatially resolved thickness characterization method for rhombohedral (3R) molybdenum disulfide (MoS$_2$) on polydimethylsiloxane (PDMS) substrates. Unlike broadband spectroscopic approaches, the proposed method reduces the measurement to a small number of discrete intensity images, enabling direct thickness mapping with a conventional microscope architecture and commercially available bandpass filters. Our approach combines a systematic framework for selecting optimal discrete wavelength samples of the material's reflectance with a robust thickness retrieval algorithm based on a multivariate Gaussian probability model. By sampling the reflectance with just five strategically chosen near-infrared bandpass filters, we demonstrate thickness characterization up to 691 nm with a mean 95% confidence-interval width of 8.3 nm. The method is adaptable to other van der Waals materials and conventional optical thin-film systems. It therefore provides a foundation for scalable, real-time thickness characterization in, e.g., dry-transfer fabrication workflows, where thickness screening remains a critical bottleneck for the production of van der Waals heterostructure devices.

physics.optics

Inverse designed metasurfaces for multi-wavelength full-Stokes polarisation imaging

Multispectral full-Stokes polarisation imaging has a broad range of applications, from biological cell imaging to agricultural remote surveying. For such applications, especially involving lightweight unmanned aerial vehicles like drones, it is necessary to have compact, single-shot, efficient optical systems. We present a topology-optimised metasurface design that diffractively separates a scene into spectral and polarimetric measurements, operating for 532 nm and 700 nm in a single-shot imaging system. The polarisation imaging performance of the design is shown in simulation to be robust to critical performance metrics, matching both spectral and angular bandwidth requirements. We fabricated our metasurface design by nanopatterning a TiO$_2$ thin film, and experimentally demonstrate polarisation reconstruction for two wavelengths with a single metasurface structure.

physics.optics

Thickness-dependence of Linear and Nonlinear Optical Properties of Multilayer 3R-MoS2

3R-MoS2, a MoS2 polytype with broken inversion symmetry, enables unique light-matter interactions and is promising for linear and nonlinear integrated photonics beyond the monolayer limit. Yet, systematic studies of its thickness-dependent reflectivity and its impact on harmonic generation are still lacking. . Yet, systematic studies of its thickness-dependent reflectivity and its impact on harmonic generation are still lacking. Here, we introduce a non-destructive optical method to determine the thickness of 3r-MoS2 flakes from reflectivity measurements, offering AFM-like precision with a mean bias of less than 2 nm range, while being much faster and applicable to non-solid substrates such as PDMS, in the 3-200 nm range. Nonlinear characterization further reveals distinct thickness-dependent maxima in second- and third-harmonic generation (SHG/THG), with the first clear peak at ~200 nm. These maxima arise from Fabry-P\'erot-type phase matching conditions mediated by the film thickness and can further be shaped by absorption. This work thus provides both a practical thickness metrology and new insights for exploiting thickness-dependent 3R-MoS2 nonlinearities in scalable photonic technologies.

physics.optics

Photonics in Flatland: Challenges and Opportunities for Nanophotonics with 2D Semiconductors

Two-dimensional (2D) semiconductors are emerging as a versatile platform for nanophotonics, offering unprecedented tunability in optical properties through exciton resonance engineering, van der Waals heterostructuring, and external field control. These materials enable active optical modulation, single-photon emission, quantum photonics, and valleytronic functionalities, paving the way for next-generation optoelectronic and quantum photonic devices. However, key challenges remain in achieving large-area integration, maintaining excitonic coherence, and optimizing amplitude-phase modulation for efficient light manipulation. Advances in fabrication, strain engineering, and computational modelling will be crucial to overcoming these limitations. This perspective highlights recent progress in 2D semiconductor-based nanophotonics, emphasizing opportunities for scalable integration into photonics.

physics.optics

A Tunable Transition Metal Dichalcogenide Entangled Photon-Pair Source

Entangled photon-pair sources are at the core of quantum applications like quantum key distribution, sensing, and imaging. Operation in space-limited and adverse environments such as in satellite-based and mobile communication requires robust entanglement sources with minimal size and weight requirements. Here, we meet this challenge by realizing a cubic micrometer scale entangled photon-pair source in a 3R-stacked transition metal dichalcogenide crystal. Its crystal symmetry enables the generation of polarization-entangled Bell states without additional components and provides tunability by simple control of the pump polarization. Remarkably, generation rate and state tuning are decoupled, leading to equal generation efficiency and no loss of entanglement. Combining transition metal dichalcogenides with monolithic cavities and integrated photonic circuitry or using quasi-phasematching opens the gate towards ultrasmall and scalable quantum devices.

quant-ph