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Cristina Figl

Publications and source records attributed to Cristina Figl.

3 recordsLinked to original sources

Semiclassical limits to the linewidth of an atom laser

We investigate the linewidth of a quasi-continuous atom laser within a semiclassical framework. In the high flux regime, the lasing mode can exhibit a number of undesirable features such as density fluctuations. We show that the output therefore has a complicated structure that can be somewhat simplified using Raman outcoupling methods and energy-momentum selection rules. In the weak outcoupling limit, we find that the linewidth of an atom laser is instantaneously Fourier limited, but, due to the energy `chirp' associated with the draining of a condensate, the long-term linewidth of an atom laser is equivalent to the chemical potential of the condensate source. We show that correctly sweeping the outcoupling frequency can recover the Fourier-limited linewidth.

quant-ph

Atom chips in the real world: the effects of wire corrugation

We present a detailed model describing the effects of wire corrugation on the trapping potential experienced by a cloud of atoms above a current carrying micro wire. We calculate the distortion of the current distribution due to corrugation and then derive the corresponding roughness in the magnetic field above the wire. Scaling laws are derived for the roughness as a function of height above a ribbon shaped wire. We also present experimental data on micro wire traps using cold atoms which complement some previously published measurements and which demonstrate that wire corrugation can satisfactorily explain our observations of atom cloud fragmentation above electroplated gold wires. Finally, we present measurements of the corrugation of new wires fabricated by electron beam lithography and evaporation of gold. These wires appear to be substantially smoother than electroplated wires.

physics.atom-ph

The role of wire imperfections in micro magnetic traps for atoms

We present a quantitative study of roughness in the magnitude of the magnetic fieldproduced by a current carrying microwire, i.e. in the trapping potential for paramagnetic atoms.We show that this potential roughness arises from deviations in the wire current flow due to geometric fluctuations of the edges of the wire : a measurement of the potentialusing cold trapped atoms agrees with the potential computed from the measurement of the wire edge roughness by a scanning electronmicroscope.

physics.atom-ph