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Damian Guenzing

Publications and source records attributed to Damian Guenzing.

2 recordsLinked to original sources

Lightfall: An API-first, LLM-addressable control platform for synchrotron beamlines

Synchrotron beamlines differ in hardware, technique, and workflow, making customized control interfaces necessary; bespoke per-beamline graphical user interfaces (GUIs) do not scale well, one-size-fits-all facility software forces compromises that leave most of the interface unused, and even recent component-library approaches keep per-scientist tweaks on a developer's queue. We present Lightfall, a control platform designed for facility-wide use, whose API-first architecture exposes every panel, device, and scan plan through a single uniform addressable interface. An embedded language-model agent drives experiments through that interface, from a single move-and-read to a Gaussian-process-driven autonomous scan, while beamline staff extend the interface during operation via skills: plugin modules the agent invokes to compose and modify panels in the running application. The result is a closed development loop: a beamline scientist authors a panel change in natural language, the agent emits and applies it, and the commit lands in the beamline's plugin repository as a side effect. The per-iteration cost of a scientist-driven change is then fixed in the scientist's own time rather than in developer hours the facility must supply. Lightfall is in testing at the COSMIC-Scattering beamline at the Advanced Light Source.

physics.ins-det

Soft X-ray Reflection Ptychography

Scanning transmission X-ray microscopy and ptychography have become mature tools for high-resolution, element-specific imaging of nanoscale structures. However, transmission geometries impose stringent constraints on sample thickness and preparation, thereby limiting investigations of extended or bulk specimens, especially in the soft X-ray region. Here, we demonstrate reflection geometry soft X-ray ptychography as a robust imaging mode. Instrumental feasibility and spatial resolution are established using a lithographically defined Siemens star and barcode test pattern on a multilayer substrate. We empirically demonstrate a full-pitch spatial resolution of ca. 45 nm from Fourier ring correlation analysis of the reconstructed object. The results highlight the potential of the reflection geometry for nondestructive X-ray studies of materials without the need for transmissive samples.

physics.optics