Searcharxiv⌕ Search

arXiv subjects

E. E. Gottschalk

Publications and source records attributed to E. E. Gottschalk.

4 recordsLinked to original sources

Search for Exotic Baryons in 800 GeV pp (rtarrow) pXiPiX

We report the results of a high-statistics, sensitive search for narrow baryon resonances decaying to $Ξ^-π^-$, $Ξ^-π^+$, $\barΞ^+π^-$, and $\barΞ^+π^+$. The only resonances observed are the well known $Ξ^0(1530)$ and $\bar{Ξ^0}(1530)$. No evidence is found for a state near 1862 MeV, previously reported by NA49\cite{NA49}. At the 95% confidence level, we find the upper limit for the production of a Gaussian enhancement with $σ=7.6$ MeV in the $Ξ^-π^-$ effective mass spectrum to be 0.3% of the number of observed $Ξ^0(1530)\toΞ^-π^+$. We find similarly restrictive upper limits for an enhancement at 1862 MeV in the $Ξ^-π^+$, $\barΞ^+π^-$, and $\barΞ^+π^+$ mass spectra.

hep-ex↗

Performance of prototype BTeV silicon pixel detectors in a high energy pion beam

The silicon pixel vertex detector is a key element of the BTeV spectrometer. Sensors bump-bonded to prototype front-end devices were tested in a high energy pion beam at Fermilab. The spatial resolution and occupancies as a function of the pion incident angle were measured for various sensor-readout combinations. The data are compared with predictions from our Monte Carlo simulation and very good agreement is found.

hep-ex↗

Beam Test of BTeV Pixel Detectors

The silicon pixel vertex detector is one of the key elements of the BTeV spectrometer. Detector prototypes were tested in a beam at Fermilab. We report here on the measured spatial resolution as a function of the incident angles for different sensor-readout electronics combinations. We compare the results with predictions from our Monte Carlo simulation.

hep-ex↗

Beam Test Results of the BTeV Silicon Pixel Detector

The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

hep-ex↗