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arXiv · hep-ex/0009023

Beam Test Results of the BTeV Silicon Pixel Detector

G. Chiodini·J. A. Appel·M. Artuso·J. N. Butler·G. Cardoso·H. Cheung·D. C. Christian·A. Colautti·R. Coluccia·M. Di Corato·E. E. Gottschalk·B. K. Hall·J. Hoff·P. A. Kasper·R. Kutschke·S. W. Kwan·A. Mekkaoui·D. Menasce·C. Newsom·S. Sala·R. Yarema·J. C. Wang·S. Zimmermann
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Abstract

The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

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G. Chiodini, J. A. Appel, M. Artuso, J. N. Butler, G. Cardoso, H. Cheung, D. C. Christian, A. Colautti, R. Coluccia, M. Di Corato, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, S. W. Kwan, A. Mekkaoui, D. Menasce, C. Newsom, S. Sala, R. Yarema, J. C. Wang, S. Zimmermann. 2000-09-07. Beam Test Results of the BTeV Silicon Pixel Detector. https://doi.org/10.1016/s0168-9002(01)00369-2

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