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Eloy Ramirez-Garcia

Publications and source records attributed to Eloy Ramirez-Garcia.

4 recordsLinked to original sources

A small-signal description of black phosphorus transistor technologies for high-frequency applications

This work presents a small-signal high-frequency (HF) equivalent circuit (EC) to model AC performances of black-phosphorous field-effect transistors (BPFETs). The proposed EC is able to describe correctly both the experimental HF intrinsic and extrinsic figures of merit, as well as S-parameters, from different BPFET technologies. Single- and double-stage radio frequency gain amplifiers, are designed at 2.4 GHz using the experimentally-calibrated small-signal BPFET EC. Results show high-gain high-selective BPFET-based amplifiers.

physics.app-ph

Multifunctional high-frequency circuit capabilities of ambipolar carbon nanotube FETs

An experimentally-calibrated carbon nanotube compact transistor model has been used here to design two high-frequency (HF) circuits with two different functionalities each: a phase configurable amplifier (PCA) and a frequency configurable amplifier (FCA). The former design involves an in-phase amplifier and an inverting amplifier while the latter design embraces a frequency doubler as well as a distinct inverting amplifier. The specific functionality selection of each of the two HF circuit designs is enabled mainly by the inherent ambipolar feature at a device level. Furthermore, at a circuit level the matching networks are the same regardless the operation mode. In-phase and inverting amplification are enabled in the PCA by switching the gate-to-source voltage (VGS) from -0.3 V to 0.9 V while the drain-to-source voltage (VDS) remains at 3 V. By designing carefully the matching and stability networks, power gains of 4.5 dB and 6.7 dB at 2.4 GHz for the in-phase and inverting operation mode have been achieved, respectively. The FCA, in its frequency doubler operation mode, exhibits 20 dBc of fundamental-harmonic suppression at 2.4 GHz when an input signal at 1.2 GHz is considered. This frequency doubler functionality is enabled at VGS=0.3 V, whereas at VGS=0.9 V amplification of 4.5 dB is obtained while VDS remains at 3 V in both cases. In both configurable circuits the stabilization and matching networks are the same regardless the bias-chosen operation mode. The circuits performance degradation due to metallic tubes in the device channel is studied as well as the impact of non-ideal inductors in each design. PCA and FCA operation modes are further exploited in high-frequency modulators.

physics.app-ph

A small-signal GFET equivalent circuit considering an explicit contribution of contact resistances

A small-signal equivalent circuit for graphene field-effect transistors is proposed considering the explicit contribution of effects at the metal-graphene interfaces by means of contact resistances. A methodology to separate the contact resistances from intrinsic parameters, obtained by a de-embedding process, and extrinsic parameters of the circuit is considered. The experimental high-frequency performance of three devices from two different GFET technologies is properly described by the proposed small-signal circuit. Some model parameters scale with the device footprint. The correct detachment of contact resistances from the internal transistor enables to assess their impact on the intrinsic cutoff frequency of the studied devices.

physics.app-ph

Contact resistance assessment and high-frequency performance projection of black phosphorus field-effect transistor technologies

In this work, an evaluation of the contact quality of black phosphorus (BP) field-effect transistors (FETs) from different technologies previously reported is performed by means of an efficient and reliable contact resistance extraction methodology based on individual device practical characteristics. A good agreement is achieved between the extracted values with the Y-function method used here and reference values obtained with other methods considering internal values as well as with more expensive methods involving fabricated test structures. The method enables a direct evaluation of different steps in the same technology and it embraces the temperature dependence of the contact characteristics. Channel phenomena have no impact on the extracted contact resistance values. High-frequency performance projections are obtained for fabricated devices based on the extracted contact resistance.

cond-mat.mes-hall