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Eric You

Publications and source records attributed to Eric You.

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On-chip probabilistic inference for charged-particle tracking at the sensor edge

Modern scientific instruments operate under increasingly extreme constraints on bandwidth, latency, and power. Inference at the sensor edge determines experimental data collection efficiency by deciding which information to save for further analysis. Particle tracking detectors at the Large Hadron Collider exemplify this challenge: pixelated silicon sensors generate rich spatiotemporal ionization patterns, yet most of this information is discarded due to data-rate limitations. Concurrently, advancements in co-design tools provide rapid turn-around for incorporating machine learning into application-specific integrated circuits, motivating designs for particle detectors with new integrated technologies. We demonstrate that neural networks embedded in the front-end electronics can infer charged-particle kinematic parameters from a single silicon layer. We regress hit positions and incident angles with calibrated uncertainties, while satisfying stringent constraints on numerical precision, latency, and silicon area. Our results establish a path toward probabilistic inference directly at the edge, opening new opportunities for intelligent sensing in high-rate scientific instruments.

physics.ins-det

Sensor Co-design for $\textit{smartpixels}$

Pixel tracking detectors at upcoming collider experiments will see unprecedented charged-particle densities. Real-time data reduction on the detector will enable higher granularity and faster readout, possibly enabling the use of the pixel detector in the first level of the trigger for a hadron collider. This data reduction can be accomplished with a neural network (NN) in the readout chip bonded with the sensor that recognizes and rejects tracks with low transverse momentum (p$_T$) based on the geometrical shape of the charge deposition (``cluster''). To design a viable detector for deployment at an experiment, the dependence of the NN as a function of the sensor geometry, external magnetic field, and irradiation must be understood. In this paper, we present first studies of the efficiency and data reduction for planar pixel sensors exploring these parameters. A smaller sensor pitch in the bending direction improves the p$_T$ discrimination, but a larger pitch can be partially compensated with detector depth. An external magnetic field parallel to the sensor plane induces Lorentz drift of the electron-hole pairs produced by the charged particle, broadening the cluster and improving the network performance. The absence of the external field diminishes the background rejection compared to the baseline by $\mathcal{O}$(10%). Any accumulated radiation damage also changes the cluster shape, reducing the signal efficiency compared to the baseline by $\sim$ 30 - 60%, but nearly all of the performance can be recovered through retraining of the network and updating the weights. Finally, the impact of noise was investigated, and retraining the network on noise-injected datasets was found to maintain performance within 6% of the baseline network trained and evaluated on noiseless data.

physics.ins-det

Characterization of a 28 nm $\textit{smartpixels}$ ASIC With On-Chip ML for Particle Tracking Detectors

We present a 28 nm CMOS pixel readout integrated circuit implementing in-pixel analog signal processing and on-chip machine learning data filtering for particle tracking detectors. Our ASIC comprises two $32 \times 8$ pixel matrices with a pixel pitch of $25 \times 25~\mu\mathrm{m}^2$, in which each pixel integrates a charge-sensitive amplifier with synchronous auto-zero offset cancellation and a 2-bit flash ADC with programmable thresholds. Two analog front-end architectures, single-ended and differential, are implemented and characterized. Digitized pixel data are combined into row-wise projections and processed by an on-chip, fully combinational neural network classifier for data reduction. Measurements at room temperature using charge injection demonstrate an equivalent noise charge of $54.6~\mathrm{e}^{-}$ and a threshold dispersion of $\sim$78.2~\unit{\electron} at nominal bias, linear response up to several~\unit{\kilo\electron}, and stable operation at a 10~MHz clock frequency. The neural network output is compared with offline RTL predictions and agrees for $99.06\%$ of $1.5 \times 10^{5}$ test inputs.

physics.ins-det