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H. Jeen

Publications and source records attributed to H. Jeen.

6 recordsLinked to original sources

Structural and Magnetic Phase Transitions in CeCu$_{6-x}T_x$ ($T$ = Ag, Pd)

The structural and the magnetic properties of CeCu$_{6-x}$Ag$_x$ (0 $\leq$ $x$ $\leq$ 0.85) and CeCu$_{6-x}$Pd$_x$ (0 $\leq$ $x$ $\leq$ 0.4) have been studied using neutron diffraction, resonant ultrasound spectroscopy (RUS), heat capacity, x-ray diffraction measurements and first principles calculations. The structural and magnetic phase diagrams of CeCu$_{6-x}$Ag$_x$ and CeCu$_{6-x}$Pd$_x$ as a function of Ag/Pd composition are reported. The end member, CeCu$_6$, undergoes a structural phase transition from an orthorhombic ($Pnma$) to a monoclinic ($P2_1/c$) phase at 240 K. In CeCu$_{6-x}$Ag$_x$, the structural phase transition temperature (${T_{s}}$) decreases linearly with Ag concentration and extrapolates to zero at $x_{S}$ $\approx$ 0.1. The structural transition in CeCu$_{6-x}$Pd$_x$ remains unperturbed with Pd substitution within the range of our study. The lattice constant $b$ slightly decreases with Ag/Pd doping, whereas, $a$ and $c$ increase with an overall increase in the unit cell volume. Both systems, CeCu$_{6-x}$Ag$_x$ and CeCu$_{6-x}$Pd$_x$, exhibit a magnetic quantum critical point (QCP), at $x$ $\approx$ 0.2 and $x$ $\approx$ 0.05 respectively. Near the QCP, long range antiferromagnetic ordering takes place at an incommensurate wave vector ($δ_1$ 0 $δ_2$) where $δ_1 \sim 0.62$, $δ_2 \sim 0.25$, $x$ = 0.125 for CeCu$_{6-x}$Pd$_x$ and $δ_1 \sim 0.64$, $δ_2 \sim 0.3$, $x$ = 0.3 for CeCu$_{6-x}$Ag$_x$. The magnetic structure consists of an amplitude modulation of the Ce-moments which are aligned along the $c$-axis of the orthorhombic unit cell.

cond-mat.str-el

Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films

We present a comparison of the in-plane length scale over which charge and magnetism are correlated in (La0.4Pr0.6)1-xCaxMnO3 films with x = 0.33 and 0.375, across the metal to insulator transition (MIT) temperature. We combine electrical transport (resistance) measurements, x-ray absorption spectroscopy (XAS), x-ray magnetic circular dichroism (XMCD), and specular/off-specular x-ray resonant magnetic scattering (XRMS) measurements as a function of temperature to elucidate relationships between electronic, magnetic and morphological structure of the thin films. Using off-specular XRMS we obtained the charge-charge and charge-magnetic correlation length of these LPCMO films near the MIT. The charge-magnetic correlation length (~ 12000 Å) for x = 0.33 was much larger (~4 times) than the charge-charge correlation length (~ 3200 Å) at 20 K. Whereas for x = 0.375 the charge-magnetic correlation length (~ 7500 Å) was smaller than the charge-charge correlation length (~ 9000 Å).

cond-mat.str-el

Manipulation of the magnetic order parameter and the metal-insulator-transition of a manganite thin film with applied elastic stress

We measured the temperature dependence of the saturation magnetization (Ms) of a (La1-xPrx)1-yCayMnO3 (x ~ 0.60, y ~ 0.33) film as a function of applied bending stress. Stress producing a compressive strain of -0.01% along the magnetic easy axis increased the Curie temperature by ~6 K and the metal-insulator-transition by ~4 K. Regardless of whether or not stress is applied to the film, magnetic ordering occurs at temperatures significantly higher than the metal-insulator-transition temperature. The magnetization of the sample at the temperature of the metal-insulator-transition is approximately the site percolation threshold for a two-dimensional spin lattice.

cond-mat.str-el

Images of metallic and insulating domains on the surface of a (La0.4Pr0.6)0.67Ca0.33MnO3 film

Using conductive atomic force microscopy, we observed non-uniform distributions of metallic and insulating domains on the surface of a single crystalline (La0.4Pr0.6)0.67Ca0.33MnO3 film grown on a (110) NdGaO3 substrate. The electronic properties of the surface exhibit thermal hysteresis. The hysteresis is similar to that of the transport and magnetism of the film bulk.

cond-mat.mtrl-sci

Measurement of the coupling between applied stress and magnetism in a manganite thin film

We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60\pm0.04, y = 0.20\pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.

cond-mat.mtrl-sci

Magnetic non-uniformity and thermal hysteresis of magnetism in a manganite thin film

We measured the chemical and magnetic depth profiles of a single crystalline (La$_{1-x}$Pr$_x$)$_{1-y}$Ca$_y$MnO$_{3-δ}$ (x = 0.52\pm0.05, y = 0.23\pm0.04, δ = 0.14\pm0.10) film grown on a NdGaO3 substrate using x-ray reflectometry, electron microscopy, electron energy-loss spectroscopy and polarized neutron reflectometry. Our data indicate that the film exhibits coexistence of different magnetic phases as a function of depth. The magnetic depth profile is correlated with a variation of chemical composition with depth. The thermal hysteresis of ferromagnetic order in the film suggests a first order ferromagnetic transition at low temperatures.

cond-mat.mtrl-sci