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arXiv · 1201.4001

Measurement of the coupling between applied stress and magnetism in a manganite thin film

Surendra Singh·M. R. Fitzsimmons·T. Lookman·H. Jeen·A. Biswas·M. A. Roldan·M. Varela
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Abstract

We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60\pm0.04, y = 0.20\pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.

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Surendra Singh, M. R. Fitzsimmons, T. Lookman, H. Jeen, A. Biswas, M. A. Roldan, M. Varela. 2012-01-19. Measurement of the coupling between applied stress and magnetism in a manganite thin film. https://doi.org/10.1103/physrevb.85.214440

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