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Meltem Sezen

Publications and source records attributed to Meltem Sezen.

2 recordsLinked to original sources

St4DeM: A software suite for multi-modal 4D-STEM acquisition techniques

A suite of acquisition applications related to the 4D-STEM technique is presented as a software package written within the Digital Micrograph environment, which is a widely used software platform in worldwide electron microscopy laboratories. The 4D-STEM technique allows the acquisition of diffraction patterns at each electron probe position in a scanning transmission electron microscope map. This suite includes 4D-STEM acquisition, ptychography, EELS/EDS spectrum imaging, tomography and basic virtual visualization and alignment methods on 4D data including incoherent differential phase contrast analysis. By integrating electron tomography with 4D-STEM and EELS SI, St4DeM enables the acquisition and analysis of 7-dimensional data.

cond-mat.mtrl-sci

Rubidium Focused Ion Beam Induced Platinum Deposition

This work presents characterization of focused ion beam induced deposition (FIBID) of platinum using both rubidium and gallium ions. Under similar beam energies, 8.5 keV for Rb$^+$ and 8.0 keV for Ga$^+$, and beam current near 10 pA, the two ion species deposited Pt films at similar rates. Energy-dispersive x-ray spectroscopy shows that the Rb$^+$ FIBID-Pt consists of similar Pt contents with much lower primary ion contents (5% Rb and 27% Ga) than the Ga$^+$ FIBID-Pt. The deposited material was also measured to have a resistivity of $8.1\times 10^4$ $\mathrm{μΩ\cdot cm}$ for the Rb$^+$ FIBID-Pt and $5.7\times 10^3$ $\mathrm{μΩ\cdot cm}$ for the Ga$^+$ FIBID-Pt.

physics.app-ph