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Nobuto Nakanishi

Publications and source records attributed to Nobuto Nakanishi.

2 recordsLinked to original sources

Density-wave phases, anisotropic transport, and Planckian dissipation in single crystals of the superconductor La3Ni2O7

Pressure-induced superconductivity in bilayer nickelates provides a platform for investigating intertwined roles of charge/spin orders and electric transport in unconventional superconductivity. However, important quantitative information on the transport, such as the absolute value of the resistivity, the anisotropy, and the scattering rate of carriers, remains insufficient due to the lack of accurate measurements using large single crystals. Here we establish a high-precision pressure-temperature phase diagram of high-quality La3Ni2O7 single crystals, by measuring the in-plane and out-of-plane resistivities. We resolve two distinct anomalies associated with density-wave formation with contrasting pressure dependences. The pressure-induced structural transition enhances not only the resistivity values for both directions, but also its anisotropy at low temperatures, demonstrating a pronounced effect of density-wave order on the charge dynamics. Superconductivity with zero-resistance emerges near the boundary where the density-wave phases are fully suppressed, and above Tc, the resistivity exhibits a temperature-linear dependence over a wide temperature range while the scattering rate falls within a regime of the Planckian limit. Our results show that pressure dramatically changes the anisotropic charge transport via modifying density-wave orders, and eventually produces a pronounced strange-metal state with strong scatterings, from which superconductivity develops. This establishes robust density-wave correlations and Planckian dissipation as remarkable features of La3Ni2O7.

cond-mat.supr-con↗

Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy

Aberration-corrected scanning transmission electron microscopy (STEM) is widely used for atomic-level imaging of materials. To accelerate the discovery of new materials based on atomic-level investigations, the throughput of aberration-corrected STEM experiments becomes more and more important. However, the throughput of the full workflow of aberration-corrected STEM is still quite low. A fundamental problem is that the preparation of high-quality thin STEM samples (lamellae) depends on manual operation. Here, inspired by the recent successes of "robot scientists", we demonstrate robotic fabrication of high-quality lamellae by focused-ion-beam (FIB) with full automation software. First, we show that robotic FIB can prepare lamellae with a high success rate, where the robotic FIB controls rough-milling, lift-out, and final-thinning processes. Then, we optimize the FIB parameters of the final-thinning process for single crystal Si. Aberration-corrected STEM imaging of these Si lamellae shows atomic-level images with 55 pm resolution. We also demonstrate robotic fabrication of high-quality lamellae of SrTiO3 and sapphire. The robotic FIB system will resolve the current bottleneck of the full workflow of aberration-corrected STEM analysis and accelerate materials discovery based on atomic-level imaging.

cond-mat.mtrl-sci↗