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O. V. Feklisova

Publications and source records attributed to O. V. Feklisova.

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Capacitance investigation of Ge nanoclusters on a silicon (001) surface grown by MBE at low temperatures

Electrical properties of multilayer arrays of germanium nanoclusters grown on the silicon (001) surface at low temperature have been studied. A correlation between the quantum dot (QD) density estimated from STM and the charge accumulated by QD layers as extracted from C-V characteristics was revealed. Temperature dependence of the C-V characteristics was studied. At low temperatures, the hysteresis was observed. DLTS spectra measured on the structures with different QD arrangements demonstrated essential distinctions.

cond-mat.mes-hall↗