arXiv subjects

Peter Phillips

Publications and source records attributed to Peter Phillips.

3 recordsLinked to original sources

arXiv2026

Single event effects in the HCCStar ASICs for ITk strip upgrade

Triple Modular Redundancy (TMR) technology has been implemented in the design of the HCCStar to reduce digital state changes and ensure reliable operation. We tested the effectiveness of the protection by placing HCCStar chips in a proton beam. We studied corrected bit flips in registers and actual single event effects in the LCB and LP paths under different proton energies. Our estimate is that the LP data-loss fraction relative to the 400 kHz readout is $O(10^{-10})$ during normal operation and there will be $O(10)$ corrected bit flips per HCCStar bit per year at the HL-LHC.

physics.ins-det↗

arXiv2026

Impact of Cold Noise on the tracking performance of ATLAS ITk short strip barrel modules using a charged particle beam

The inner tracking system of the ATLAS experiment will be upgraded to a full silicon detector in 2030 for HL-LHC. The new tracking system is called ITk, the Inner Tracker. It is required to be operable with efficiency higher than 99\% and noise hit occupancy smaller than 0.1\%. During the pre-production phase of the ITk project, many short-strip modules were observed to exhibit so-called "Cold Noise (CN)", wherein clusters of strips displayed very high noise when the modules were operated at temperatures below~$-35\degree$C. To investigate the CN impact and ensure the quality of module production, huge amount of effort have been put in by the collaboration. This paper focuses on the impact of CN on the tracking performance by examining two short strip modules that exhibit CN: one is non-irradiated, while the other one has been irradiated to the maximum expected end-of-lifetime fluence. For each module, the global and single strip tracking performance are evaluated.

physics.ins-det↗

arXiv2025

Silicon pinhole strip defects and their impact on ATLAS Inner Tracker HV current measurement

In preparation for the High-Luminsoity LHC (HL-LHC), the ATLAS detector will undergo major detector upgrades, including the replacement of the current Inner Detector with the new all-silicon Inner Tracker (ITk). The ITk consists of a pixel detector close to the beamline surrounded by a large-area strip detector. During detector production, the electrical properties of silicon sensors and readout electronics must be characterized through a series of quality control (QC) and quality assurance tests. These tests ensure any defect is captured at the earliest possible stage. One such defect, called a pinhole, occurs when the strip implant and the metal readout electrode are shorted through the intermediary dielectric layer. Notably, the introduction of pinholes during module assembly and pinhole effects on completed modules, especially on leakage current measurement circuitry, have never been studied. In this paper, we investigate the effect of such connections on the sensor leakage current measurements of completed modules and introduce new ways to locate pinholed strips. With minor modifications to testing procedures, such defects are shown not to impede module testing or performance.

physics.ins-det↗