arXiv subjects

Philippe Jonnard

Publications and source records attributed to Philippe Jonnard.

23 records · Page 2Linked to original sources

arXiv2012

An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance

Etched multilayers obtained by forming a laminar grating pattern within interferential multilayer mirrors are used in the soft x-ray range to improve the spectral resolution of wavelength dispersive spectrometers equipped with periodic multilayers. We describe the fabrication process of such an etched multilayer dispersive element, its characterization through reflectivity measurement and simulations, and its implementation in a high-resolution Johann-type spectrometer. The specially designed patterning of a Mo/B4C multilayer is found fruitful in the range of the C K emission as the diffraction pattern narrows by a factor 4 with respect to the non-etched structure. This dispersive element with an improved spectral resolution was successfully implemented for electronic structure study with an improved spectral resolution by x-ray emission spectroscopy. As first results we present the distinction between the chemical states of carbon atoms in various compounds, such as graphite, SiC and B4C, by the different shape of their C K emission band.

physics.ins-det↗

arXiv2012

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

We present the results of the characterization of Mg/Co periodic multilayers and their thermal stability for the EUV range. The annealing study is performed up to a temperature of 400\degree C. Images obtained by scanning transmission electron microscopy and electron energy loss spectroscopy clearly show the good quality of the multilayer structure. The measurements of the EUV reflectivity around 25 nm (~49 eV) indicate that the reflectivity decreases when the annealing temperature increases above 300\degreeC. X-ray emission spectroscopy is performed to determine the chemical state of the Mg atoms within the Mg/Co multilayer. Nuclear magnetic resonance used to determine the chemical state of the Co atoms and scanning electron microscopy images of cross sections of the Mg/Co multilayers reveal changes in the morphology of the stack from an annealing temperature of 305\degreee;C. This explains the observed reflectivity loss.

cond-mat.mtrl-sci↗

arXiv2011

Cauchois and Sénémaud Tables of wavelengths of X-ray emission lines and absorption edges

We present the Cauchois and Sénémaud Tables of X-ray emission lines and absorption edges. They are written both in French and English. They were published in 1978 by Pergamon Press and are insufficiently known. However they are of large interest because of their completeness. They comprise the energies of all the K, L, M, N and O emission lines of natural elements from lithium up to uranium as well as the energies of satellite emissions and absorption discontinuities. The more intense lines of radio-elements up to fermium (Z = 100) are also given. The Tables range from the hard X-rays (122 keV, 0.01 nm) to the extreme ultra-violet (12 eV, 102 nm). For each transition, the wavelength (Å and uX) and energy (eV and Ry) are given and references are indicated. The transitions are grouped by increasing wavelength (decreasing photon energy) and also by element and spectral series. We present, as an example, the use of the Tables to identify the emissions of the molybdenum L spectrum. We decided to scan the Cauchois and Sénémaud Tables and make them available for the scientific community. They are now available at the Website of our laboratory, http://www.lcpmr.upmc.fr/.

physics.atom-ph↗

arXiv2011

On the Kramers-Kronig transform with logarithmic kernel for the reflection phase in the Drude model

We use the Kramers-Kronig transform (KKT) with logarithmic kernel to obtain the reflection phase and, subsequently, the complex refractive index of a bulk mirror from reflectance. However, there remains some confusion regarding the formulation for this analysis. Assuming the damped Drude model for the dielectric constant and the oblique incidence case, we calculate the additional terms: phase at zero frequency and Blashke factor and we propose a reformulated KKT within this model. Absolute reflectance in the s-polarization case of a gold film is measured between 40 and 350 eV for various glancing angles using synchrotron radiation and its complex refractive index is deduced using the reformulated KKT that we propose. The results are discussed with respect to the data available in the literature.

physics.optics↗

arXiv2011

Introduction of Zr in nanometric periodic Mg/Co multilayers

We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45deg of grazing incidence and reaches 51.3% upon annealing at 200deg C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.

cond-mat.mtrl-sci↗