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S Raja

Publications and source records attributed to S Raja.

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Randomized Black-Box PIT for Small Depth +-Regular Non-commutative Circuits

We address the black-box polynomial identity testing (PIT) problem for non-commutative polynomials computed by $+$-regular circuits, a class of homogeneous circuits introduced by [AJMR](STOC 2017, Theory of Computing 2019). These circuits can compute polynomials with a number of monomials that are doubly exponential in the circuit size. They gave an efficient randomized PIT algorithm for +-regular circuits of depth 3 and posed the problem of developing an efficient black-box PIT for higher depths as an open problem. We present a randomized black-box polynomial-time algorithm for +-regular circuits of any constant depth. Specifically, our algorithm runs in $s^{O(d^2)}$ time, where $s$ and $d$ represent the size and the depth of the $+$-regular circuit, respectively. We combine several key techniques in a novel way. We employ a nondeterministic substitution automaton that transforms the polynomial into a structured form and utilizes polynomial sparsification along with commutative transformations to maintain non-zeroness. Additionally, we introduce matrix composition, coefficient modification via the automaton, and multi-entry outputs-methods that have not previously been applied in the context of black-box PIT. Together, these techniques enable us to effectively handle exponential degrees and doubly exponential sparsity in non-commutative settings, enabling polynomial identity testing for higher-depth circuits. Our work resolves an open problem from [AJMR]. In particular, we show that if $f$ is a non-zero non-commutative polynomial in $n$ variables over the field $\mathbb{F}$, computed by a depth-$d$ $+$-regular circuit of size $s$, then $f$ cannot be a polynomial identity for the matrix algebra $\mathbb{M}_{N}(\mathbb{F})$, where $N= s^{O(d^2)}$ and the size of the field $\mathbb{F}$ depending on the degree of $f$.

cs.CC

On the Hardness of the Determinant: Sum of Regular Set-Multilinear Circuits

In this paper, we study the computational complexity of the commutative determinant polynomial computed by a class of set-multilinear circuits which we call regular set-multilinear circuits. Regular set-multilinear circuits are commutative circuits with a restriction on the order in which they can compute polynomials. A regular circuit can be seen as the commutative analogue of the ordered circuit defined by Hrubes,Wigderson and Yehudayoff [HWY10]. We show that if the commutative determinant polynomial has small representation in the sum of constantly many regular set-multilinear circuits, then the commutative permanent polynomial also has a small arithmetic circuit.

cs.CC

Identity Testing for +-Regular Noncommutative Arithmetic Circuits

An efficient randomized polynomial identity test for noncommutative polynomials given by noncommutative arithmetic circuits remains an open problem. The main bottleneck to applying known techniques is that a noncommutative circuit of size $s$ can compute a polynomial of degree exponential in $s$ with a double-exponential number of nonzero monomials. In this paper, we report some progress by dealing with two natural subcases (both allow for polynomials of exponential degree and a double exponential number of monomials): (1) We consider \emph{$+$-regular} noncommutative circuits: these are homogeneous noncommutative circuits with the additional property that all the $+$-gates are layered, and in each $+$-layer all gates have the same syntactic degree. We give a \emph{white-box} polynomial-time deterministic polynomial identity test for such circuits. Our algorithm combines some new structural results for $+$-regular circuits with known results for noncommutative ABP identity testing [RS05PIT], rank bound of commutative depth three identities [SS13], and equivalence testing problem for words [Loh15, MSU97, Pla94]. (2) Next, we consider $ΣΠ^*Σ$ noncommutative circuits: these are noncommutative circuits with layered $+$-gates such that there are only two layers of $+$-gates. These $+$-layers are the output $+$-gate and linear forms at the bottom layer; between the $+$-layers the circuit could have any number of $\times$ gates. We given an efficient randomized \emph{black-box} identity testing problem for $ΣΠ^*Σ$ circuits. In particular, we show if $f\in F $ is a nonzero noncommutative polynomial computed by a $ΣΠ^*Σ$ circuit of size $s$, then $f$ cannot be a polynomial identity for the matrix algebra $\mathbb{M}_s(F)$, where the field $F$ is a sufficiently large extension of $F$ depending on the degree of $f$.

cs.CC