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S. D. Barber

Publications and source records attributed to S. D. Barber.

At least 19 recordsLinked to original sources

Asteroseismology of the ZZ Ceti star WD 1310+583 using the Transiting Exoplanet Survey Satellite

Aims. By analysing the light curves of the ZZ Ceti star WD 1310+583, we aim to determine its pulsational frequencies and to give constraints on the main stellar parameters using the tools of asteroseismology. Methods. We performed the Fourier analysis of the TESS light curves of WD 1310+583 and selected the possible pulsational modes. We also used spectroscopic data collected with the Cosmic Origins Spectrograph of the Hubble Space Telescope to give constraints for the asteroseismic analysis. We perform the latter with period-to-period fits using fully evolutionary white dwarf models. Results. The star presented in this paper shows a particularly large number (41) of pulsational frequencies, which provides a potential opportunity for detailed asteroseismic investigations. We found a mean period spacing of ~40.5 seconds, which allows us to state that the stellar mass of WD 1310+583 would be larger than ~0.57 M_Sun. We also attempted an asteroseismological analysis by performing period-to-period fits, but we were unable to find a single statistically significant asteroseismological solution. We adopted a tentative solution consisting of a white dwarf model with M* = 0.632 M_Sun, Teff = 11 702 K, and an asteroseismic distance d = 27.75 +0.17/-0.15 pc, which is significantly smaller than the one predicted by Gaia (d = 30.79 +/- 0.2 pc). We also determined that the rotational period of our target is 1.18 d.

astro-ph.SR

Controlling Mn Depth Profiles in GaMnAs During High-Temperature Molecular Beam Epitaxial Growth

Mn-doped GaAs thin films were grown at a high substrate temperature of 580 C. During the growth process, the Mn cell temperature was ramped at different rates, resulting in a variety of different Mn concentration depth profile slopes, as measured using dynamic secondary ion mass spectrometry (SIMS). Results show that controlling the Mn deposition rate via temperature during molecular beam epitaxy (MBE) growth can mitigate the effect of Mn atoms diffusing toward the surface. Most importantly, the slope of the Mn concentration as a function of depth inside the sample can be tuned from negative to positive.

cond-mat.mes-hall

Giant Surface Charge Density of Graphene Resolved From Scanning Tunneling Microscopy and First-Principles Theory

In this work, systematic constant-bias, variable-current scanning tunneling microscopy (STM) measurements and STM simulations from density-functional theory are made, yielding critical insights into the spatial structure of electrons in graphene. A foundational comparison is drawn between graphene and graphite, showing the surface charge density of graphene to be 300 percent that of graphite. Furthermore, simulated STM images reveal that high-current STM better resolves graphenes honeycomb bonding structure because of a retraction which occurs in the topmost dangling bond orbitals.

cond-mat.mes-hall

Atomic Control of Strain in Freestanding Graphene

In this study, we describe a new experimental approach based on constant-current scanning tunneling spectroscopy to controllably and reversibly pull freestanding graphene membranes up to 35 nm from their equilibrium height. In addition, we present scanning tunneling microscopy (STM) images of freestanding graphene membranes with atomic resolution. Atomic-scale corrugation amplitudes 20 times larger than the STM electronic corrugation for graphene on a substrate were observed. The freestanding graphene membrane responds to a local attractive force created at the STM tip as a highly-conductive yet flexible grounding plane with an elastic restoring force. We indicate possible applications of our method in the controlled creation of pseudo-magnetic fields by strain on single-layer graphene.

cond-mat.mes-hall

High-Percentage Success Method for Preparing and Pre-Evaluating Tungsten Tips for Atomic-Resolution Scanning Tunneling Microscopy

A custom double-lamella method is presented for electrochemically etching tungsten wire for use as tips in scanning tunneling microscopy (STM). For comparison, tips were also manufactured in-house using numerous conventional methods and examined using an optical microscope. Both sets of tips were used to obtain STM images of highly-oriented pyrolytic graphite, the quality of which varied. The clarity of the STM images was found to be correlated to the optically-measured cone angle of the STM tip, with larger cone angles consistently producing atomically resolved images. The custom etching procedure described allows one to create larger cone angles and consequently proved superior in reliably producing high-quality tips.

cond-mat.mes-hall

A Pathway between Bernal and Rhombohedral Stacked Graphene Layers with Scanning Tunneling Microscopy

Horizontal shifts in the top layer of highly oriented pyrolytic graphite, induced by a scanning tunneling microscope (STM) tip, are presented. Excellent agreement is found between STM images and those simulated using density functional theory. First-principle calculations identify that the low-energy barrier direction of the top layer displacement is toward a structure where none of the carbon pz orbitals overlap, while the high-energy barrier direction is toward AA stacking. Each directional shift yields a real-space surface charge density similar to graphene; however the low-energy barrier direction requires only one bond length to convert ABA (Bernal) to ABC (rhombohedral).

cond-mat.mes-hall

Schottky barrier and attenuation length for hot hole injection in non-epitaxial Au on p-type GaAs

Ballistic electron emission microscopy (BEEM) was performed to obtain nanoscale current versus bias characteristics of non-epitaxial Au on p-type GaAs in order to accurately measure the local Schottky barrier height. Hole injection BEEM data was averaged from thousands of spectra for various metal film thicknesses and then used to determine the attenuation length of the energetic charge carriers as a function of tip bias. We report the marked increase in attenuation length at biases near the Schottky barrier, providing evidence for the existence of coherent BEEM currents in Schottky diodes. These results provide additional evidence against the randomization of a charge carrier's momentum at the metal-semiconductor interface.

cond-mat.mes-hall

Electromechanical properties of freestanding graphene functionalized with tin oxide (SnO2) nanoparticles

Freestanding graphene membranes were functionalized with SnO2 nanoparticles. A detailed procedure providing uniform coverage and chemical synthesis is presented. Elemental composition was determined using scanning electron microscopy combined with energy dispersive X-ray analysis. A technique called electrostatic-manipulation scanning tunneling microscopy was used to probe the electromechanical properties of functionalized freestanding graphene samples. We found ten times larger movement perpendicular to the plane compared to pristine freestanding graphene, and propose a nanoparticle encapsulation model.

cond-mat.mes-hall

Electronic transition from graphite to graphene via controlled movement of the top layer with scanning tunneling microscopy

A series of measurements using a technique called electrostatic-manipulation scanning tunneling microscopy (EM-STM) were performed on a highly-oriented pyrolytic graphite surface. The electrostatic interaction between the STM tip and the sample can be tuned to produce both reversible and irreversible large-scale movement of the graphite surface. Under this influence, atomic-resolution STM images reveal that a continuous electronic transition from triangular symmetry, where only alternate atoms are imaged, to hexagonal symmetry can be systematically controlled. Density functional theory (DFT) calculations reveal that this transition can be related to vertical displacements of the top layer of graphite relative to the bulk. Evidence for horizontal shifts in the top layer of graphite is also presented. Excellent agreement is found between experimental STM images and those simulated using DFT.

cond-mat.mes-hall

New Scanning Tunneling Microscopy Technique Enables Systematic Study of the Unique Electronic Transition from Graphite to Graphene

A series of measurements using a novel technique called electrostatic-manipulation scanning tunneling microscopy were performed on a highly-oriented pyrolytic graphite (HOPG) surface. The electrostatic interaction between the STM tip and the sample can be tuned to produce both reversible and irreversible large-scale vertical movement of the HOPG surface. Under this influence, atomic-resolution STM images reveal that a continuous electronic reconstruction transition from a triangular symmetry, where only alternate atoms are imaged, to a honeycomb structure can be systematically controlled. First-principles calculations reveal that this transition can be related to vertical displacements of the top layer of graphite relative to the bulk. Detailed analysis of the band structure predicts that a transition from parabolic to linear bands occurs after a 0.09 nm displacement of the top layer.

cond-mat.mes-hall

Broad frequency and amplitude control of vibration in freestanding graphene via scanning tunneling microscopy with calculated dynamic pseudo-magnetic fields

A technique to locally generate mechanical vibrations in freestanding graphene using scanning tunneling microscopy (STM) is presented. The frequency of the mechanical vibrations is tuned over nearly four decades and is centered around 10 Hz. The amplitude of the vibrations also changes over nearly three decades centered on 1 nm. The oscillating motion is generated in two ways: first, by scanning the STM tip on the surface and second, by scanning the bias voltage on the STM tip. The frequency and amplitude of the displaced freestanding graphene is quantitatively transformed to the frequency and strength of the locally generated pseudo-magnetic field for our specific geometry.

cond-mat.mes-hall

Graphene Manipulation on 4H-SiC(0001) Using Scanning Tunneling Microscopy

Atomic-scale topography of epitaxial multilayer graphene grown on 4H-SiC(0001) was investigated using scanning tunneling microscopy (STM). Bunched nano-ridges ten times smaller than previously recorded were observed throughout the surface, the morphology of which was systematically altered using a relatively new technique called electrostatic-manipulation scanning tunneling microscopy. Transformed graphene formations sometimes spontaneously returned to their original morphology, while others permanently changed. Using an electrostatic model, we calculate that a force up to ~5 nN was exerted by the STM tip, and an energy of around 10 eV was required to alter the geometry of a ~100 X 200 nm^2 area.

cond-mat.mes-hall

Atomic-Scale Movement Induced in Nano-Ridges by Scanning Tunneling Microscopy on Epitaxial Graphene Grown on 4H-SiC(0001)

Nanoscale ridges in epitaxial multilayer graphene grown on the silicon face of 4 degree off-cut 4H-SiC (0001) were found using scanning tunneling microscopy (STM). These nano-ridges are only 0.1 nm high and 25-50 nm wide, making them much smaller than previously reported ridges. Atomic-resolution STM was performed near and on top of the nano-ridges using a dual scanning technique in which forward and reverse images are simultaneously recorded. An apparent 100% enlarged graphene lattice constant is observed along the leading edge of the image for both directions. Horizontal movement of the graphene, due to both an electrostatic attraction to the STM tip and weak bonding to the substrate, is thought to contribute to the results.

cond-mat.mes-hall

Role of bias voltage and tunneling current in the perpendicular displacements of freestanding graphene via scanning tunneling microscopy

Systematic displacement measurements of freestanding graphene as a function of applied bias voltage and tunneling current setpoint using scanning tunneling microscopy (STM) are presented. When the bias voltage is increased the graphene approaches the STM tip, while, on the other hand, when the tunneling current is increased the graphene contracts from the STM tip. To understand the role of the bias voltage, we quantitatively model the attractive force between the tip and the sample using electrostatics. For the tunneling current, we qualitatively model the contraction of the graphene using entropic concepts. These complementary results enhance the understanding of each other and highlight peculiarities of the system.

cond-mat.mes-hall

Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips

An extension of the direct-current, double-lamella drop-off technique for electrochemically etching tungsten scanning-tunneling-microscope tips is presented. The key fabrication step introduced here is the use of an etch stop as a simple but accurate way to optimize the contact area between the etchant and the wire. By restricting the etching process, the final cone angle of the tips can be made sharp and mechanically stable without a lot of finesse from the STM tip maker.

cond-mat.mes-hall

Competing scanning tunneling microscope tip-interlayer interactions for twisted multilayer graphene on the a-plane SiC surface

Scanning tunneling microscopy (STM) images are obtained for the first time on few layer and twisted multilayer epitaxial graphene states synthesized on n+ 6H-SiC a-plane non-polar surface. The twisted graphene is determined to have a rotation angle of 5.4° between the top two layers, by comparing moiré patterns from stick and ball models of bilayer graphene to experimentally obtained images. Furthermore, the experimental moiré pattern shows dynamic behavior, continuously shuffling between two stable surface arrangements one bond length apart. The moiré pattern shifts by more than 1 nm, making it easy to observe with STM. Explanation of this dynamic behavior is attributed to electrostatic interactions between the STM tip and the graphene sample.

cond-mat.mes-hall

Thermal mirror buckling in freestanding graphene locally controlled by scanning tunneling microscopy

Knowledge of and control over the curvature of ripples in freestanding graphene are desirable for fabricating and designing flexible electronic devices, and recent progress in these pursuits has been achieved using several advanced techniques such as scanning tunneling microscopy. The electrostatic forces induced through a bias voltage (or gate voltage) were used to manipulate the interaction of freestanding graphene with a tip (substrate). Such forces can cause large movements and sudden changes in curvature through mirror buckling. Here we explore an alternative mechanism, thermal load, to control the curvature of graphene. We demonstrate thermal mirror buckling of graphene by scanning tunneling microscopy and large-scale molecular dynamic simulations. The negative thermal expansion coefficient of graphene is an essential ingredient in explaining the observed effects. This new control mechanism represents a fundamental advance in understanding the influence of temperature gradients on the dynamics of freestanding graphene and future applications with electro-thermal-mechanical nanodevices.

cond-mat.mes-hall