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Sangik Lee

Publications and source records attributed to Sangik Lee.

2 recordsLinked to original sources

UDC-VIT: A Real-World Video Dataset for Under-Display Cameras

Even though an Under-Display Camera (UDC) is an advanced imaging system, the display panel significantly degrades captured images or videos, introducing low transmittance, blur, noise, and flare issues. Tackling such issues is challenging because of the complex degradation of UDCs, including diverse flare patterns. However, no dataset contains videos of real-world UDC degradation. In this paper, we propose a real-world UDC video dataset called UDC-VIT. Unlike existing datasets, UDC-VIT exclusively includes human motions for facial recognition. We propose a video-capturing system to acquire clean and UDC-degraded videos of the same scene simultaneously. Then, we align a pair of captured videos frame by frame, using discrete Fourier transform (DFT). We compare UDC-VIT with six representative UDC still image datasets and two existing UDC video datasets. Using six deep-learning models, we compare UDC-VIT and an existing synthetic UDC video dataset. The results indicate the ineffectiveness of models trained on earlier synthetic UDC video datasets, as they do not reflect the actual characteristics of UDC-degraded videos. We also demonstrate the importance of effective UDC restoration by evaluating face recognition accuracy concerning PSNR, SSIM, and LPIPS scores. UDC-VIT is available at our official GitHub repository.

cs.CV

Tunneling transport of mono- and few-layers magnetic van der Waals MnPS$_3$

We have investigated the tunneling transport of mono- and few-layers of MnPS3 by using conductive atomic force microscopy. Due to the band alignment of indium tin oxide/MnPS3/Pt-Ir tip junction, the key features of both Schottky junction and Fowler-Nordheim tunneling (FNT) were observed for all the samples with varying thickness. Using the FNT model and assuming the effective electron mass (0.5 me) of MnPS3, we estimate the tunneling barrier height to be 1.31 eV and the dielectric breakdown strength as 5.41 MV/cm.

cond-mat.mes-hall