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Shan Shen

Publications and source records attributed to Shan Shen.

16 recordsLinked to original sources

HOLMES: In-Context Failure-Center Localization for High-Dimensional Yield Estimation

Importance sampling for high-sigma yield estimation requires locating the failure center from a severely imbalanced sample set. Existing surrogate-assisted methods rely on iterative gradient-based training, ill-posed under extreme class imbalance; model errors propagate into the estimator, causing accuracy collapse in high dimensions. We recast failure-center localization as few-shot binary classification: a prior-fitted tabular foundation model performs gradient-free in-context inference in a single forward pass, eliminating the ill-posed training loop. \textbf{HOLMES} (High-sigma Optimal Localization via Manifold Estimation and Sampling) pairs this with an SVD-based anisotropic proposal that captures the local geometry of the failure manifold, and a hit-rate-driven adaptive mixing scheme that stabilizes importance weights where conventional adaptation collapses. On 6T SRAM benchmarks spanning $D = 108$ to $D = 1{,}152$, full-dimensional baselines exhibit accuracy collapse at some dimension, with the strongest baseline reaching 25.8\% relative error; PCA+MNIS is additionally evaluated at the two largest dimensions. HOLMES remains within 5.9\% across all five configurations with up to $58.8\times$ speedup over Monte Carlo. The code is available on \href{https://github.com/IceLab-JCIE/ICE006-Yield-Holmes}

cs.AR

ParasGB: A Graph Benchmark Suite for Parasitic Estimation on AMS Circuits

As chip manufacturing processes advance to deep submicron nodes, parasitic interconnect effects increasingly dominate the performance of analog and mixed-signal (AMS) circuits and often lead to costly layout iterations. This makes early-stage estimation of parasitic capacitance and resistance important for parasitic-aware design exploration before full physical implementation. However, progress on GNN-based parasitic modeling has been hindered by the lack of public, high-fidelity RC benchmarks that support reproducible evaluation. To address this gap, we introduce ParasGB, the first open-source benchmark suite for pre-layout parasitic parameter prediction on circuit graphs. ParasGB provides large-scale, heterogeneous RC networks extracted with commercial EDA tools from tape-out-proven designs, together with a unified evaluation protocol covering node-level ground capacitance, edge-level resistance, and edge-level coupling capacitance. Within this framework, we benchmark diverse GNN architectures using a standardized training pipeline and expose challenges such as extreme label imbalance, long-tailed parasitic distributions, and strong structural heterogeneity. By establishing a physically grounded and standardized benchmark for early-stage parasitic prediction, ParasGB provides an open platform for reproducible research on circuit graph learning and parasitic-aware model development. All datasets, preprocessing scripts, and configurations are publicly available in our code repository https://github.com/ShenShan123/ParasGB.git.

cs.LG

OpenOpt: An Open-Source SRAM Optimizer Based on Equivalent Circuit Model

This paper proposes a co-optimization framework that jointly optimizes SRAM architecture and transistor sizing using equivalent circuit models. The framework simplifies inactive SRAM cells into equivalent RC loads and static power models, achieving up to 61.4$\times$ simulation speedup while maintaining high fidelity (read/write delay error $<$0.22%, power error $<$1.68%). A joint search space encompassing architecture parameters and device sizing integrates seven algorithms including SA, PSO, Bayesian Optimization variants, and multi-objective evolutionary algorithms. Based on FreePDK45, ablation experiments confirm complementary gains from architecture selection and transistor sizing. Among all algorithms, MOEA/D achieves the best Figure of Merit (8.2721), yielding 6.2% improvement in SNM, 73.6% reduction in area, and 42.3% reduction in peak power. The framework is publicly available at https://github.com/W1Y1K1/OpenOpt.

cs.NE

Accuracy-Configurable Floating-Point Multiplier Design for SRAM-Based Compute-in-Memory

Digital Compute-in-Memory (DCiM) reduces data movement and has become a promising solution for energy-efficient edge AI. However, most existing DCiM frameworks still primarily target integer or fixed-point arithmetic, and provide limited support for compiler-integrated and accuracy-configurable floating-point computation. Directly integrating conventional IEEE 754 floating-point units into dense SRAM-based DCiM arrays, however, incurs high area and power overhead. To address this challenge, this work presents an accuracy-configurable floating-point multiplier integrated into the OpenACM framework for SRAM-based DCiM. An exact IEEE~754-compliant multiplier is first implemented as a baseline, and a mantissa-segmentation-based approximate multiplier is then proposed to reduce hardware cost while preserving numerical fidelity. Post-layout results show up to 69% logic area reduction and 72% power savings over exact floating-point designs without delay overhead. Evaluations on image processing tasks and ResNet-18 inference further demonstrate negligible accuracy degradation. These results indicate that compiler-integrated approximate floating-point multiplication is a practical approach for enabling efficient and configurable floating-point support in SRAM-based DCiM systems. The Floating-Point Multiplier is available on https://github.com/ShenShan123/OpenACM

cs.AR

R2G: A Multi-View Circuit Graph Benchmark Suite from RTL to GDSII

Graph neural networks (GNNs) are increasingly applied to physical design tasks such as congestion prediction and wirelength estimation, yet progress is hindered by inconsistent circuit representations and the absence of controlled evaluation protocols. We present R2G (RTL-to-GDSII), a multi-view circuit-graph benchmark suite that standardizes five stage-aware views with information parity (every view encodes the same attribute set, differing only in where features attach) over 30 open-source IP cores (up to $10^6$ nodes/edges). R2G provides an end-to-end DEF-to-graph pipeline spanning synthesis, placement, and routing stages, together with loaders, unified splits, domain metrics, and reproducible baselines. By decoupling representation choice from model choice, R2G isolates a confound that prior EDA and graph-ML benchmarks leave uncontrolled. In systematic studies with GINE, GAT, and ResGatedGCN, we find: (i) view choice dominates model choice, with Test R$^2$ varying by more than 0.3 across representations for a fixed GNN; (ii) node-centric views generalize best across both placement and routing; and (iii) decoder-head depth (3--4 layers) is the primary accuracy driver, turning divergent training into near-perfect predictions (R$^2$$>$0.99). Code and datasets are available at https://github.com/ShenShan123/R2G.

cs.CV

OpenACMv2: An Accuracy-Constrained Co-Optimization Framework for Approximate DCiM

Digital Compute-in-Memory (DCiM) accelerates neural networks by reducing data movement. Approximate DCiM can further improve power-performance-area (PPA), but demands accuracy-constrained co-optimization across coupled architecture and transistor-level choices. Building on OpenYield, we introduce Accuracy-Constrained Co-Optimization (ACCO) and present OpenACMv2, an open framework that operationalizes ACCO via two-level optimization: (1) accuracy-constrained architecture search of compressor combinations and SRAM macro parameters, driven by a fast GNN-based surrogate for PPA and error; and (2) variation- and PVT-aware transistor sizing for standard cells and SRAM bitcells using Monte Carlo. By decoupling ACCO into architecture-level exploration and circuit-level sizing, OpenACMv2 integrates classic single- and multi-objective optimizers to deliver strong PPA-accuracy tradeoffs and robust convergence. The workflow is compatible with FreePDK45 and OpenROAD, supporting reproducible evaluation and easy adoption. Experiments show that the proposed two-level ACCO framework achieves most of its accuracy-constrained efficiency gain at Level-1 through architecture exploration, delivering roughly 50%+ PDP reduction, while Level-2 transistor-level optimization provides a further single-digit PDP improvement while preserving accuracy, enabling rapid "what-if" exploration for approximate DCiM. The framework is available on GitHub (https://github.com/ShenShan123/OpenACM).

cs.LG

Breaking the Tuning Barrier: Zero-Hyperparameters Yield Multi-Corner Analysis Via Learned Priors

Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of $O(K \times N)$ where $K$ denotes corners and $N$ exceeds $10^4$ samples per corner. Existing methods face a fundamental trade-off: simple models achieve automation but fail on nonlinear circuits, while advanced AI models capture complex behaviors but require hours of hyperparameter tuning per design iteration, forming the Tuning Barrier. We break this barrier by replacing engineered priors (i.e., model specifications) with learned priors from a foundation model pre-trained on millions of regression tasks. This model performs in-context learning, instantly adapting to each circuit without tuning or retraining. Its attention mechanism automatically transfers knowledge across corners by identifying shared circuit physics between operating conditions. Combined with an automated feature selector (1152D to 48D), our method matches state-of-the-art accuracy (mean MREs as low as 0.11%) with zero tuning, reducing total validation cost by over $10\times$.

cs.LG

OpenACM: An Open-Source SRAM-Based Approximate CiM Compiler

The rise of data-intensive AI workloads has exacerbated the ``memory wall'' bottleneck. Digital Compute-in-Memory (DCiM) using SRAM offers a scalable solution, but its vast design space makes manual design impractical, creating a need for automated compilers. A key opportunity lies in approximate computing, which leverages the error tolerance of AI applications for significant energy savings. However, existing DCiM compilers focus on exact arithmetic, failing to exploit this optimization. This paper introduces OpenACM, the first open-source, accuracy-aware compiler for SRAM-based approximate DCiM architectures. OpenACM bridges the gap between application error tolerance and hardware automation. Its key contribution is an integrated library of accuracy-configurable multipliers (exact, tunable approximate, and logarithmic), enabling designers to make fine-grained accuracy-energy trade-offs. The compiler automates the generation of the DCiM architecture, integrating a transistor-level customizable SRAM macro with variation-aware characterization into a complete, open-source physical design flow based on OpenROAD and the FreePDK45 library. This ensures full reproducibility and accessibility, removing dependencies on proprietary tools. Experimental results on representative convolutional neural networks (CNNs) demonstrate that OpenACM achieves energy savings of up to 64\% with negligible loss in application accuracy. The framework is available on \href{https://github.com/ShenShan123/OpenACM}{OpenACM:URL}

cs.AR

OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite

Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transferability, as promising academic techniques often fail to carry over to more realistic settings. We present OpenYield, an open-source ecosystem that aims to narrow this gap through three contributions: (i) An SRAM circuit generator that explicitly incorporates second-order effects (interconnect/line parasitics, inter-cell leakage coupling, and peripheral-circuit variations) that are commonly omitted in academic studies. (ii) A standardized evaluation platform with a simple interface and baseline yield-analysis implementations to enable fair comparisons and reproducible research on these higher-fidelity circuits. (iii) An optimization platform for transistor-level sizing under these models, supporting reproducible studies of robustness/efficiency trade-offs. OpenYield aims to foster more reproducible and transferable progress in SRAM-yield research. The framework is publicly available at https://github.com/ShenShan123/OpenYield

cs.AR

Transferable Parasitic Estimation via Graph Contrastive Learning and Label Rebalancing in AMS Circuits

Graph representation learning on Analog-Mixed Signal (AMS) circuits is crucial for various downstream tasks, e.g., parasitic estimation. However, the scarcity of design data, the unbalanced distribution of labels, and the inherent diversity of circuit implementations pose significant challenges to learning robust and transferable circuit representations. To address these limitations, we propose CircuitGCL, a novel graph contrastive learning framework that integrates representation scattering and label rebalancing to enhance transferability across heterogeneous circuit graphs. CircuitGCL employs a self-supervised strategy to learn topology-invariant node embeddings through hyperspherical representation scattering, eliminating dependency on large-scale data. Simultaneously, balanced mean squared error (BMSE) and balanced softmax cross-entropy (BSCE) losses are introduced to mitigate label distribution disparities between circuits, enabling robust and transferable parasitic estimation. Evaluated on parasitic capacitance estimation (edge-level task) and ground capacitance classification (node-level task) across TSMC 28nm AMS designs, CircuitGCL outperforms all state-of-the-art (SOTA) methods, with the $R^2$ improvement of $33.64\% \sim 44.20\%$ for edge regression and F1-score gain of $0.9\times \sim 2.1\times$ for node classification. Our code is available at https://github.com/ShenShan123/CircuitGCL.

cs.LG

Few-shot Learning on AMS Circuits and Its Application to Parasitic Capacitance Prediction

Graph representation learning is a powerful method to extract features from graph-structured data, such as analog/mixed-signal (AMS) circuits. However, training deep learning models for AMS designs is severely limited by the scarcity of integrated circuit design data. In this work, we present CircuitGPS, a few-shot learning method for parasitic effect prediction in AMS circuits. The circuit netlist is represented as a heterogeneous graph, with the coupling capacitance modeled as a link. CircuitGPS is pre-trained on link prediction and fine-tuned on edge regression. The proposed method starts with a small-hop sampling technique that converts a link or a node into a subgraph. Then, the subgraph embeddings are learned with a hybrid graph Transformer. Additionally, CircuitGPS integrates a low-cost positional encoding that summarizes the positional and structural information of the sampled subgraph. CircuitGPS improves the accuracy of coupling existence by at least 20\% and reduces the MAE of capacitance estimation by at least 0.067 compared to existing methods. Our method demonstrates strong inherent scalability, enabling direct application to diverse AMS circuit designs through zero-shot learning. Furthermore, the ablation studies provide valuable insights into graph models for representation learning.

cs.LG

Deep-Learning-Based Pre-Layout Parasitic Capacitance Prediction on SRAM Designs

To achieve higher system energy efficiency, SRAM in SoCs is often customized. The parasitic effects cause notable discrepancies between pre-layout and post-layout circuit simulations, leading to difficulty in converging design parameters and excessive design iterations. Is it possible to well predict the parasitics based on the pre-layout circuit, so as to perform parasitic-aware pre-layout simulation? In this work, we propose a deep-learning-based 2-stage model to accurately predict these parasitics in pre-layout stages. The model combines a Graph Neural Network (GNN) classifier and Multi-Layer Perceptron (MLP) regressors, effectively managing class imbalance of the net parasitics in SRAM circuits. We also employ Focal Loss to mitigate the impact of abundant internal net samples and integrate subcircuit information into the graph to abstract the hierarchical structure of schematics. Experiments on 4 real SRAM designs show that our approach not only surpasses the state-of-the-art model in parasitic prediction by a maximum of 19X reduction of error but also significantly boosts the simulation process by up to 598X speedup.

cs.LG

SRAM-PG: Power Delivery Network Benchmarks from SRAM Circuits

Designing the power delivery network (PDN) in very large-scale integrated (VLSI) circuits is increasingly important, especially for nowadays low-power integrated circuit (IC) design. In order to ensure that the designed PDN enables a low level of voltage drop and noise which is required for the success of IC design, accurate analysis of PDN is largely demanded and brings a challenge of computation during the whole process of IC design. This promotes the research of efficient and scalable simulation methods for PDN. However, the lack of sufficient public PDN benchmarks hinders the relevant research. % on this aspect since it is hard to conduct a rapid and clear comparison between different approaches to solving this problem. To this end, we construct and release a set of PDN benchmarks (named \emph{SRAM-PG}) from SRAM circuit design in this work. The benchmarks are obtained from realistic and state-of-the-art SRAM designs, following a workflow for generating the post-layout PDN netlists with full RC parasitics. With careful modeling of load currents, the benchmarks reflect the dynamic work mode of the IC and can be used for both transient and DC analysis. The benchmarks are derived from the designs for diverse applications. And, sharing them in the public domain with detailed descriptions would largely benefit the relevant research. The whole set of benchmarks is available at \href{github}{https://github.com/ShenShan123/SRAM-PG}.

cs.AR

Ultra8T: A Sub-Threshold 8T SRAM with Leakage Detection

In energy-constrained scenarios such as IoT applications, the primary requirement for System-on-Chips (SoCs) is to increase battery life. However, when performing sub/near-threshold operations, the relatively large leakage current hinders Static Random Access Memory (SRAM) from normal read/write functionalities at the lowest possible voltage (VDDMIN). In this work, we propose an Ultra8T SRAM to aggressively reduce VDDMIN by using a leakage detection strategy where the safety sensing time on bitlines is quantified without any additional hardware overhead. We validate the proposed Ultra8T using a 256x64 array in 28nm CMOS technology. Post-simulations show successful read operation at 0.25V with 1.11{\mu}s read delay, and the minimum energy required is 1.69pJ at 0.4V.

cs.AR

TS Cache: A Fast Cache with Timing-speculation Mechanism Under Low Supply Voltages

To mitigate the ever-worsening Power Wall problem, more and more applications need to expand their power supply to the wide-voltage range including the near-threshold region. However, the read delay distribution of the SRAM cells under the near-threshold voltage shows a more serious long-tail characteristic than that under the nominal voltage due to the process fluctuation. Such degradation of SRAM delay makes the SRAM-based cache a performance bottleneck of systems as well. To avoid the unreliable data reading, circuit-level studies use larger/more transistors in a bitcell by scarifying chip area and the static power of cache arrays. Architectural studies propose the auxiliary error correction or block disabling/remapping methods in fault-tolerant caches, which worsen both the hit latency and energy efficiency due to the complex accessing logic. This paper proposes the Timing-Speculation (TS) cache to boost the cache frequency and improve energy efficiency under low supply voltages. In the TS cache, the voltage differences of bitlines are continuously evaluated twice by a sense amplifier (SA), and the access timing error can be detected much earlier than that in prior methods. According to the measurement results from the fabricated chips, the TS L1 cache aggressively increases its frequency to 1.62X and 1.92X compared with the conventional scheme at 0.5V and 0.6V supply voltages, respectively.

cs.AR

A Timing Yield Model for SRAM Cells in Sub/Near-threshold Voltages Based on A Compact Drain Current Model

Sub/Near-threshold static random-access memory (SRAM) design is crucial for addressing the memory bottleneck in energy-constrained applications. However, the high integration density and reliability under process variations demand an accurate estimation of extremely small failure probabilities. To capture such a rare event in memory circuits, the time and storage overhead of conventional Monte Carlo (MC) simulations cannot be tolerated. On the other hand, classic analytical methods predicting failure probabilities from a physical expression become inaccurate in the sub/near-threshold region due to the assumed distribution or the oversimplified drain current model for nanoscale devices. This work first proposes a simple but efficient drain current model to describe the drain-induced barrier lowering effect at low voltages. Based on that, the probability density functions of the interest metrics in SRAM are derived. Two analytical models are then put forward to evaluate SRAM dynamic stabilities including access and write-time failures. The proposed models can be extended easily to different types of SRAM with different read/write assist circuits. The models are validated against MC simulations across different operating voltages and temperatures. The average relative errors at 0.5V VDD are only 8.8% and 10.4% for the access-time and write failure models respectively. The size of required data samples is 43.6X smaller than that of the state-of-the-art method.

cs.AR