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arXiv · 2508.04106

OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite

Shan Shen·Xingyang Li·Zhuohua Liu·Junhao Ma·Yikai Wang·Yiheng Wu·Yuquan Sun·Wei W. Xing
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Abstract

Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transferability, as promising academic techniques often fail to carry over to more realistic settings. We present OpenYield, an open-source ecosystem that aims to narrow this gap through three contributions: (i) An SRAM circuit generator that explicitly incorporates second-order effects (interconnect/line parasitics, inter-cell leakage coupling, and peripheral-circuit variations) that are commonly omitted in academic studies. (ii) A standardized evaluation platform with a simple interface and baseline yield-analysis implementations to enable fair comparisons and reproducible research on these higher-fidelity circuits. (iii) An optimization platform for transistor-level sizing under these models, supporting reproducible studies of robustness/efficiency trade-offs. OpenYield aims to foster more reproducible and transferable progress in SRAM-yield research. The framework is publicly available at https://github.com/ShenShan123/OpenYield

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Shan Shen, Xingyang Li, Zhuohua Liu, Junhao Ma, Yikai Wang, Yiheng Wu, Yuquan Sun, Wei W. Xing. 2025-08-06. OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite. https://arxiv.org/abs/2508.04106

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