arXiv subjects
Publications and source records attributed to Sorina Lazanu.
In the present work, the bulk degradation of SiC in hadron (pion and proton) fields, in the energy range between 100 MeV and 10 GeV, is characterised theoretically by means of the concentration of primary defects per unit fluence. The results are compared to the similar ones corresponding to diamond, silicon and GaAs.
A phenomenological model was developed to explain quantitatively, without free parameters, the production of primary defects in silicon after particle irradiation, the kinetics of their evolution toward equilibrium and their influence on detector parameters. The type of the projectile particle and its energy is considered in the evaluation of the concentration of primary defects. Vacancy-interstitial annihilation, interstitial migration to sinks, vacancy - impurity complexes (VP, VO, V2O), and divacancy (V2) formation are taken into account in different irradiation conditions, for different concentrations of impurities in the semiconductor material, for 20 and 0 degrees C. The model can be extended to include other vacancy and interstitial complexes. The density of the reverse current in the detector after irradiation is estimated. Comparison with experimental measurements is performed. A special application considered in the paper is the modelled case of the behaviour of silicon detectors operating in the pion field estimated for the LHC accelerator, under continuum generation and annealing.
The concentration of primary radiation induced defects has been previously estimated considering both the explicit mechanisms of the primary interaction between the incoming particle and the nuclei of the semiconductor lattice, and the recoil energy partition between ionisation and displacements, in the frame of the Lindhard theory. The primary displacement defects are vacancies and interstitials, that are essentially unstable in silicon. They interact via migration, recombination, annihilation or produce other defects. In the present work, the time evolution of the concentration of defects induced by pions in medium and high resistivity silicon for detectors is modelled, after irradiation. In some approximations, the differential equations representing the time evolution processes could be decoupled. The theoretical equations so obtained are solved analytically in some particular cases, with one free parameter, for a wide range of particle fluences and/or for a wide energy range of the incident particles, for different temperatures; the corresponding stationary solutions are also presented.
The utilisation of crystalline semiconductor materials as detectors and devices operating in high radiation environments, at the future particle colliders, in space applications, in medicine and industry, makes necessary to obtain radiation harder materials. Diamond, SiC and different AIIIBV compounds (GaAs, GaP, InP, InAs, InSb) are possible competitors for silicon to different electronic devices for the up-mentioned applications. The main goal of this paper is to give theoretical predictions about the behaviour of these semiconductors in hadron fields (pions, protons). The effects of the interaction between the incident particle and the semiconductor are characterised in the present paper both from the point of view of the projectile, the relevant quantity being the energy loss by nuclear interactions, and of the target, using the concentration of primary radiation induced defects on unit particle fluence. Some predictions about the damage induced by hadrons in these materials in possible applications in particle physics and space experiments are done.