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Stefania Stucci

Publications and source records attributed to Stefania Stucci.

4 recordsLinked to original sources

Silicon pinhole strip defects and their impact on ATLAS Inner Tracker HV current measurement

In preparation for the High-Luminsoity LHC (HL-LHC), the ATLAS detector will undergo major detector upgrades, including the replacement of the current Inner Detector with the new all-silicon Inner Tracker (ITk). The ITk consists of a pixel detector close to the beamline surrounded by a large-area strip detector. During detector production, the electrical properties of silicon sensors and readout electronics must be characterized through a series of quality control (QC) and quality assurance tests. These tests ensure any defect is captured at the earliest possible stage. One such defect, called a pinhole, occurs when the strip implant and the metal readout electrode are shorted through the intermediary dielectric layer. Notably, the introduction of pinholes during module assembly and pinhole effects on completed modules, especially on leakage current measurement circuitry, have never been studied. In this paper, we investigate the effect of such connections on the sensor leakage current measurements of completed modules and introduce new ways to locate pinholed strips. With minor modifications to testing procedures, such defects are shown not to impede module testing or performance.

physics.ins-det

Time Resolution Characterization of 4H-SiC LGADs with a ${}^{90}$Sr Source

This work presents timing measurements of 4H-SiC Low Gain Avalanche Detectors (4H-SiC LGADs) using beta particles from a ${}^{90}$Sr source. The 4H-SiC LGADs exhibit fast signal responses, and a time resolution of 61~ps was achieved, comparable to that of standard Si LGADs. The present limitation in the time resolution of 4H-SiC LGADs appears to stem from limited charge generation. Nevertheless, their higher voltage tolerance and faster carrier drift suggest that, with increased charge collection, their timing performance could approach or even surpass that of Si LGADs. These results demonstrate the strong potential of 4H-SiC LGADs as a robust platform for precision timing in future 4D tracking detectors, while also highlighting that signal charge is the dominant factor currently limiting their performance, indicating that further optimization of gain and drift structures will be essential for future development.

physics.ins-det

Impact of Proton Irradiation on 4H-SiC Low Gain Avalanche Detectors (LGADs)

Silicon carbide (SiC) particle detectors have the potential to provide time resolutions and robust performance in extreme environments which exceed that of silicon detectors. In this work 4H-SiC low gain avalanche detectors (LGADs) and complementary PiN diodes were irradiated with 2.5 GeV protons at fluences up to 3.33$\times$10$^{14}$ p/cm$^2$. The electrostatic performance of both irradiated and non-irradiated devices was evaluated using current-voltage (I-V) and capacitance-voltage (C-V) measurements. Moreover, charge collection measurements using $\alpha$ particles were also conducted. SiC LGADs displayed a loss in rectification and gain with increasing proton fluence. Additionally, the reduction in capacitance and OFF-state current pointed to compensation of the gain layer as a gain reducing mechanism. The introduction of radiation induced defects also hinders carrier acceleration reducing impact ionization, leading to further gain reduction. However, despite the reduction in device performance, the demonstration of a measurable signal and gain after irradiation points to the potential of SiC LGAD detectors for future high energy physics applications.

physics.ins-det

Characterization of 4H-SiC Low Gain Avalanche Detectors (LGADs)

4H-SiC low gain avalanche detectors (LGADs) have been fabricated and characterized. The devices employ a circular mesa design with low-resistivity contacts and an SiO$_2$ passivation layer. The I-V and C-V characteristics of the 4H-SiC LGADs are compared with complementary 4H-SiC PiN diodes to confirm a high breakdown voltage and low leakage current. Both LGADs and PiN diodes were irradiated with $\alpha$ particles from a $^{210}_{84}\rm{Po}$ source. The charge collected by each device was compared, and it was observed that low-gain charge carrier multiplication is achieved in the 4H-SiC LGAD.

physics.ins-det