arXiv subjects

Thomas A. Grant

Publications and source records attributed to Thomas A. Grant.

4 recordsLinked to original sources

arXiv2026

Improving Optical Metrology by Engineering the Target Environment

Measurements of positional coordinates and dimensions - whether by human vision or optical instrumentation - are fundamental to safety, industrial productivity, manufacturing quality/accuracy, and scientific discovery. The ultimate precision of such measurements is governed by the Fisher information conveyed from an object to a detector through the optical field, and strategies for enhancing measurement performance often focus on reducing detector noise and/or refining estimation algorithms. Building on the emerging understanding of Fisher information as a physical quantity that propagates through space in a wave-like fashion, we demonstrate that substantial gains in precision can also be made by engineering the electromagnetic environment of a measurement target to optimise the generation and transmission of Fisher information. Using nanowire position metrology based on light scattering at a wavelength λ = 640 nm as an architype system, we achieve a multifold enhancement in localisation precision, reaching beyond λ/10,000. Our results establish target environment engineering as a powerful and broadly applicable strategy for advancing measurement and sensing performance across platforms ranging from optical characterisation of micro- and nano-objects to microwave radars and optical LiDAR navigation systems.

physics.optics↗

arXiv2026

Controlling the Flow of Information in Optical Metrology

Optical metrology has progressed beyond the Abbe-Rayleigh limit, unlocking (sub)atomic precision by leveraging nonlinear phenomena, statistical accumulation, and AI estimators trained on measurand variations. Here, we show that Fisher information, which defines the fundamental precision limit, can be viewed as a physical entity that propagates through space, and we derive a wave equation for sensitivity fields describing its flow, which can resonate, diffract, and interfere. We reveal how material composition, geometry, and environmental design dictate where information is generated and how it travels, analogous to antennas and metasurfaces sculpting electromagnetic energy. Plasmonic and dielectric resonances enhance information flow, while gratings and near-field structures reshape radiation patterns. This perspective reframes metrology as a discipline in which resolution can be engineered by tailoring information sources and flow for applications in atomic-scale diagnostics and beyond, including optimisation of Light Detection and Ranging (LiDAR), remote sensing, and radar technologies.

physics.optics↗

arXiv2025

Resolving Complex Subwavelength Grating Structures Using Topologically Structured Light

It has been seen recently that when probing a nanoscale object to determine, for example, size or position via light scattering, significant advantage in measurement precision can be gained from exploiting phase singularities in a topologically structured incident light field. Here, we demonstrate that this advantage, derived from the dependence of scattered intensity profiles on strong local (subwavelength-scale) intensity and phase variations in the incident field, can be extended towards imaging applications: Analysis of scattering patterns from arbitrary binary gratings under superoscillatory illumination successfully resolves feature sizes down to ~λ/7 in single-shot measurements (a factor of 1.4x smaller than is achieved with plane wave illumination), and ~λ/10.5 in positionally-displaced multi-shot measurements (which yields no improvement in the plane wave case). Interestingly, there are circumstances in which more complex objects are better resolved than simple structures, because interference effects increase the information content of their scattering patterns.

physics.optics↗

arXiv2024

Localization of nanoscale objects with light singularities

Unprecedented atomic-scale measurement resolution has recently been demonstrated in single-shot optical localization metrology based on deep-learning analyses of diffraction patterns of topologically structured light scattered from objects. Here we show that variations in the diffraction patterns caused by positional changes of an object depend upon the spatial derivatives of the magnitude and phase of the incident field, with the latter strongly enhanced at phase singularities. Despite lower intensity near the singularity, an orders-of-magnitude increase in Fisher information contained in the diffraction patterns can be achieved when a nano-object is illuminated by light containing phase singularities, rather than a plane wave. Our work provides a fundamental explanation and motivation for singularity-based metrology with deeply subwavelength precision.

physics.optics↗