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arXiv · 2508.13640

Controlling the Flow of Information in Optical Metrology

Maximilian Weimar·Huanli Zhou·Luca Neubacher·Thomas A. Grant·Jakob Hüpfl·Kevin F. MacDonald·Stefan Rotter·Nikolay I. Zheludev
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Abstract

Optical metrology has progressed beyond the Abbe-Rayleigh limit, unlocking (sub)atomic precision by leveraging nonlinear phenomena, statistical accumulation, and AI estimators trained on measurand variations. Here, we show that Fisher information, which defines the fundamental precision limit, can be viewed as a physical entity that propagates through space, and we derive a wave equation for sensitivity fields describing its flow, which can resonate, diffract, and interfere. We reveal how material composition, geometry, and environmental design dictate where information is generated and how it travels, analogous to antennas and metasurfaces sculpting electromagnetic energy. Plasmonic and dielectric resonances enhance information flow, while gratings and near-field structures reshape radiation patterns. This perspective reframes metrology as a discipline in which resolution can be engineered by tailoring information sources and flow for applications in atomic-scale diagnostics and beyond, including optimisation of Light Detection and Ranging (LiDAR), remote sensing, and radar technologies.

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Maximilian Weimar, Huanli Zhou, Luca Neubacher, Thomas A. Grant, Jakob Hüpfl, Kevin F. MacDonald, Stefan Rotter, Nikolay I. Zheludev. 2025-08-19. Controlling the Flow of Information in Optical Metrology. https://arxiv.org/abs/2508.13640

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