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Tim Thyzel

Publications and source records attributed to Tim Thyzel.

4 recordsLinked to original sources

Cross-correlation on a single channel for resistance noise measurements

Cross-correlation is an established tool to reduce the background in resistance noise measurements. However, the conventional method requires the amplifier, demodulator and digitizer channels to be duplicated, increasing the cost and complexity of the measurement circuit. We propose an alternating-current technique that allows cross-correlation with only a single channel by modulating the device under test with two carrier frequencies simultaneously. Using multiple software-based demodulators, we show that this method produces accurate amplitude measurements and noise spectra. The signal-to-noise-ratio is improved by 7 decibel for standard parameters. Longer measurement durations increase this improvement, which makes the new technique a true cross-correlation method.

physics.ins-det

Software-defined lock-in demodulator for low-frequency resistance noise measurements

The resolution of low-frequency resistance noise measurements can be increased by amplitude modulation, shifting the spectrum of the resistance fluctuations away from the 1/f noise contributed by measurement instruments. However, commercial lock-in amplifiers used for de-modulating the fluctuations exhibit a problematic 1/f noise contribution, which imposes a hard lower limit on the relative resistance noise that can be detected. We replace the lock-in amplifier hardware by equivalent digital signal processing performed using open-source software and off-the-shelf data acquisition systems. Compared to previous implementations of the lock-in principle, our solution offers real-time preview capabilities and is resource-efficient for long acquisition times at high sampling rates. Importantly, compared to high-end commercial lock-in instruments, our system offers superior low-frequency noise performance with a reduction of the voltage power spectral density by about two orders of magnitude.

physics.ins-det

Comparison of the charge-crystal and charge-glass state in geometrically frustrated organic conductors studied by fluctuation spectroscopy

We present a systematic investigation of the low-frequency charge carrier dynamics in different charge states of the organic conductors $\theta$-(BEDT-TTF)$_2$$M$Zn(SCN)$_4$ with $M$=Rb,Tl, which result from quenching or relaxing the charge degrees of freedom on a geometrically frustrated triangular lattice. Due to strong electronic correlations these materials exhibit a charge-ordering transition, which can be kinetically avoided by rapid cooling resulting in a so-called charge-glass state without long-range order. The combination of fluctuation spectroscopy and a heat pulse method allows us to study and compare the resistance fluctuations in the low-resistive quenched and the high-resistive charge-ordered state, revealing striking differences in the respective noise magnitudes. For both compounds, we find strongly enhanced resistance fluctuations right at the metal-insulator transition and a broad noise maximum in the slowly cooled charge-crystal state with partly dominating two-level processes revealing characteristic activation energies.

cond-mat.str-el

Involvement of structural dynamics in the charge-glass formation in molecular metals

We present a combined study of thermal expansion and resistance fluctuation spectroscopy measurements exploring the static and dynamic aspects of the charge-glass formation in the quasi-two-dimensional organic conductors $\theta$-(BEDT-TTF)$_2$$MM^\prime$(SCN)$_4$ with $M$ = Cs and $M^\prime$ = Co,Zn. In these materials, the emergence of a novel charge-glass state so far has been interpreted in purely electronic terms by considering the strong frustration of the Coulomb interactions on a triangular lattice. Contrary to this view, we provide comprehensive evidence for the involvement of a \textit{structural} glass-like transition at $T_{\text{g}} \sim 90-100\,$K. This glassy transition can be assigned to the freezing of structural conformations of the ethylene endgroups in the donor molecule with an activation energy of $E_{\rm{a}}\approx 0.32\,$eV, and the concomitant slowing down of the charge carrier dynamics is well described by a model of non-exponential kinetics. These findings discolse an important aspect of the phase diagram and renders the current understanding of the charge-glass state in the whole family of $\theta$-(BEDT-TTF)$_2MM^\prime$(SCN)$_4$ incomplete. Our results suggest that the entanglement of slow structural and charge-cluster dynamics due to the intimate coupling of lattice and electronic degrees of freedom determine the charge-glass formation under geometric frustration.

cond-mat.str-el