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Timo Häußermann

Publications and source records attributed to Timo Häußermann.

2 recordsLinked to original sources

Tailoring spin defects in diamond

Atomic-size spin defects in solids are unique quantum systems. Most applications require nanometer positioning accuracy, which is typically achieved by low energy ion implantation. So far, a drawback of this technique is the significant residual implantation-induced damage to the lattice, which strongly degrades the performance of spins in quantum applications. In this letter we show that the charge state of implantation-induced defects drastically influences the formation of lattice defects during thermal annealing. We demonstrate that charging of vacancies localized at e.g. individual nitrogen implantation sites suppresses the formation of vacancy complexes, resulting in a tenfold-improved spin coherence time of single nitrogen-vacancy (NV) centers in diamond. This has been achieved by confining implantation defects into the space charge layer of free carriers generated by a nanometer-thin boron-doped diamond structure. Besides, a twofold-improved yield of formation of NV centers is observed. By combining these results with numerical calculations, we arrive at a quantitative understanding of the formation and dynamics of the implanted spin defects. The presented results pave the way for improved engineering of diamond spin defect quantum devices and other solid-state quantum systems.

cond-mat.mtrl-sci↗

Statistical investigations on nitrogen-vacancy center creation

Experiments show that shallow nitrogen implantations (<10keV) result in a negatively charged nitrogen-vacancy center (NV-) yield of 0.01-0.1%. The most succesful technique for introducing NV- centers in the carbon matrix is ion implantation followed by annealing at 1100K. We investigated the influence of channeling effects during shallow implantation and statistical diffusion using molecular dynamics (MD) and Monte Carlo (MC) approaches. Energy barriers for the diffusion process were calculated using the density functional theory (DFT). Our simulations show a significant difference in the NV yield compared to the experiment. Statistically, 25% of the implanted nitrogens form a NV center after annealing.

cond-mat.mtrl-sci↗