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U. Mohideen

Publications and source records attributed to U. Mohideen.

58 records · Page 4Linked to original sources

Casimir and van der Waals force between two plates or a sphere (lens) above a plate made of real metals

The Casimir and van der Waals forces acting between two metallic plates or a sphere (lens) above a plate are calculated accounting for the finite conductivity of the metals. The simple formalism of surface modes is briefly presented which allows the possibility to obtain the generalization of Lifshitz results for the case of two semi-spaces covered by the thin layers. Additional clarifications of the regularization procedure provides the means to obtain reliable results not only for the force but also for the energy density. This, in turn, leads to the value of the force for the configuration of a sphere (lens) above a plate both of which are covered by additional layers. The Casimir interaction between Al and Au test bodies is recalculated using the optical tabulated data for the complex refractive index of these metals. The computations turn out to be in agreement with the perturbation theory up to the fourth order in relative penetration depth of electromagnetic zero point oscillations into the metal. The disagreements between the results recently presented in the literature are resolved. The Casimir force between Al bodies covered by the thin Au layers is computed and the possibility to neglect spatial dispersion effects is discussed as a function the layer thickness. The van der Waals force is calculated including the transition region to the Casimir force. The pure non-retarded van der Waals force law between Al and Au bodies is shown to be restricted to a very narrow distance interval from 0.5 nm to (2--4) nm. New, more exact, values of the Hamaker constant for Al and Au are determined.

quant-ph↗

Improved Precision Measurement of the Casimir Force

We report an improved precision measurement of the Casimir force. The force is measured between a large Al coated sphere and flat plate using an Atomic Force Microscope. The primary experimental improvements include the use of smoother metal coatings, reduced noise, lower systematic errors and independent measurement of surface separations. Also the complete dielectric spectrum of the metal is used in the theory. The average statistical precision remains at the same 1% of the forces measured at the closest separation.

quant-ph↗

Complete roughness and conductivity corrections for the recent Casimir force measurement

We consider detailed roughness and conductivity corrections to the Casimir force in the recent Casimir force measurement employing an Atomic Force Microscope. The roughness of the test bodies-a metal plate and a sphere- was investigated with the Atomic Force Microscope and the Scanning Electron Microscope respectively. It consists of separate crystals of different heights and a stochastic background. The amplitude of roughness relative to the zero roughness level was determined and the corrections to the Casimir force were calculated up to the fourth order in a small parameter (which is this amplitude divided by the distance between the two test bodies). Also the corrections due to finite conductivity were found up to the fourth order in relative penetration depth of electromagnetic zero point oscillations into the metal. The theoretical result for the configuration of a sphere above a plate taking into account both corrections is in excellent agreement with the measured Casimir force.

quant-ph↗

Precision Measurement of the Casimir Force from 0.1 to 0.9 microns

We have used an atomic force microscope to make precision measurements of the Casimir force between a metallized sphere of diameter 196 microns and flat plate. The force was measured for plate-sphere separations from 0.1 to 0.9 microns. The experimental results are consistent with present theoretical calculations including the finite conductivity, roughness, and temperature corrections. The root mean square average deviation of 1.6 pN between theory and experiment corresponds to a 1% deviation at the smallest separation.

physics.optics↗