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Xingchen He

Publications and source records attributed to Xingchen He.

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A 3.584 Tbps coherent receiver chip on InP-LiNbO3 wafer-level integration platform

The rapid advancement of the thin-film lithium niobate (LiNbO3) platform has established it as a premier choice for high-performance photonics integrated circuits. However, the scalability and cost-efficiency of this platform are hindered by the reliance on chip-level fabrication and integration for passive and active components, necessitating a robust wafer-level LiNbO3 heterogeneous integration platform. Despite its critical role in enabling ultrahigh-speed optical interconnects, as well as optical mmWave/THz sensing and communication, the realization of ultrahigh-speed photodiodes and optical coherent receivers on the LiNbO_3 platform remains an unresolved challenge. This is primarily due to the challenges associated with the large-scale integration of direct-bandgap materials. To address these challenges, we have developed a scalable, high-speed InP-LiNbO3 wafer-level heterogeneous integration platform. This platform facilitates the fabrication of ultrahigh-speed photodiodes with a bandwidth of 140 GHz, capable of receiving high-quality 100-Gbaud pulse amplitude modulation (PAM4) signals. Moreover, we demonstrate a seven-channel, single-polarization I-Q coherent receiver chip with an aggregate receiving capacity of 3.584 Tbit/s. This coherent receiver exhibits a balanced detection bandwidth of 60 GHz and a common mode rejection ratio (CMRR) exceeding 20 dB. It achieves receiving capacities of 600 Gbit/s/\lambda with a 100-Gbaud 64-QAM signal and 512 Gbit/s/\lambda with a 128-Gbaud 16-QAM signal. Furthermore, energy consumption as low as 9.6 fJ/bit and 13.5 fJ/bit is achieved for 200 Gbit/s and 400 Gbit/s capacities, respectively. Our work provides a viable pathway toward enabling Pbps hyperscale data center interconnects, as well as optical mmWave/THz sensing and communication.

physics.optics

CMOS based high-resolution dynamic X-ray imaging with inorganic perovskite

High-resolution dynamic X-ray detector is crucial for time-resolved digital radiography (DR) imaging and fast 3D medical computed tomography (CT) imaging. Recently, perovskites have become promising alternatives to conventional semi-conductor materials, e.g., Si, a-Se and CdTe, for direct X-ray detection. However, the feasibility of their combination with high-speed pixelated complementary metal-oxide-semiconductor (CMOS) arrays remains unknown. This work originally reports an innovative direct-conversion X-ray detector fabricated with 300 micrometer thick inorganic perovskite film printed on a tailored CMOS array. In-house measurements demonstrate that the CsPbBr3 film has excellent optoelectric properties of an electron mobility-lifetime product of 3.40x10$^{-5}$ cm$^2$ V$^{-1}$, and the X-ray detector exhibits high sensitivity of 9341uC Gy$_{\rm air}^{-1}$ cm$^{-2}$, and low detection limit of 588 nGy$_{\rm air}^{-1}$. This CMOS X-ray imaging detector achieves a high spatial resolution up to 5.5 lp/mm (close to the resolution limit of 6.0 lp/mm), and >300 frame per second (fps) readout speed. DR image of a resolution pattern phantom and a anesthesia mice, CT images of a biological specimen are acquired for the first time.

physics.app-ph