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arXiv · 0704.2752

Modelling Thickness-Dependence of Ferroelectric Thin Film Properties

L. Palova·P. Chandra·K. M. Rabe
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Abstract

We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.

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L. Palova, P. Chandra, K. M. Rabe. 2007-10-07. Modelling Thickness-Dependence of Ferroelectric Thin Film Properties. https://doi.org/10.1103/physrevb.76.014112

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