arXiv · 1002.1877
Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope
Abstract
Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200 nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the free surface at the crack tip.
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Kun Han, Matteo Ciccotti, Stéphane Roux. 2010-02-09. Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope. https://doi.org/10.1209/0295-5075%2F89%2F66003
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