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arXiv · 1102.3273

Field emission from single and few-layer graphene flakes

S. Santandrea·F. Giubileo·V. Grossi·S. Santucci·M. Passacantando·T. Schroeder·G. Lupina·A. Di Bartolomeo
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Abstract

We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2/Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes, used as electrodes to realize local measurements of the field emission current. We achieved field emission currents up to 1 μA from the flat part of graphene flakes at applied fields of few hundred V/μm. We found that emission process is stable over a period of several hours and that it is well described by a Fowler-Nordheim model for currents over 5 orders of magnitude.

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S. Santandrea, F. Giubileo, V. Grossi, S. Santucci, M. Passacantando, T. Schroeder, G. Lupina, A. Di Bartolomeo. 2011-02-16. Field emission from single and few-layer graphene flakes. https://doi.org/10.1063/1.3579533

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