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arXiv · 1209.5502

A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

Thomas Quaglio·Franck Dahlem·Sylvain Martin·Anne Gerardin·Clemens Winkelmann·Hervé Courtois
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Abstract

We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.

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Thomas Quaglio, Franck Dahlem, Sylvain Martin, Anne Gerardin, Clemens Winkelmann, Hervé Courtois. 2012-09-25. A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device. https://doi.org/10.1063/1.4769258

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