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arXiv · 1210.7763

Optical Absorption Measurements on Crystalline Silicon at 1550nm

Jessica Steinlechner·Christoph Krüger·Nico Lastzka·Sebastian Steinlechner·Alexander Khalaidovski·Roman Schnabel
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Abstract

Crystalline silicon is currently being discussed as test-mass material for future generations of gravitational wave detectors that will operate at cryogenic temperatures. We present optical absorption measurements on a large-dimension sample of crystalline silicon at a wavelength of 1550nm at room temperature. The absorption was measured in a monolithic cavity setup using the photo-thermal self-phase modulation technique. The result for the absorption coefficient of this float-zone sample with a specific resistivity of 11kOhm cm was measured to be \alpha_A=(264 +/- 39)ppm/cm.

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Jessica Steinlechner, Christoph Krüger, Nico Lastzka, Sebastian Steinlechner, Alexander Khalaidovski, Roman Schnabel. 2012-10-29. Optical Absorption Measurements on Crystalline Silicon at 1550nm. https://doi.org/10.1088/0264-9381/30/9/095007

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