arXiv · 1212.6292
High Mobility Ambipolar MoS2 Field-Effect Transistors: Substrate and Dielectric Effects
Abstract
We fabricate MoS2 field effect transistors on both SiO2 and polymethyl methacrylate (PMMA) dielectrics and measure charge carrier mobility in a four-probe configuration. For multilayer MoS2 on SiO2, the mobility is 30-60 cm2/Vs, relatively independent of thickness (15-90 nm), and most devices exhibit unipolar n-type behavior. In contrast, multilayer MoS2 on PMMA shows mobility increasing with thickness, up to 470 cm2/Vs (electrons) and 480 cm2/Vs (holes) at thickness ~50 nm. The dependence of the mobility on thickness points to a long-range dielectric effect of the bulk MoS2 in increasing mobility.
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Wenzhong Bao, Xinghan Cai, Dohun Kim, Karthik Sridhara, Michael S. Fuhrer. 2012-12-27. High Mobility Ambipolar MoS2 Field-Effect Transistors: Substrate and Dielectric Effects. https://doi.org/10.1063/1.4789365
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