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arXiv · 1301.0218

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

J. Tisler·T. Oeckinghaus·R. Stöhr·R. Kolesov·F. Reinhard·J. Wrachtrup
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Abstract

We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

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J. Tisler, T. Oeckinghaus, R. Stöhr, R. Kolesov, F. Reinhard, J. Wrachtrup. 2013-01-02. Single Defect Center Scanning Near-Field Optical Microscopy on Graphene. https://doi.org/10.1021/nl401129m

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