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arXiv · 1411.0653

Afterpulsing studies of low noise InGaAs/InP single-photon negative feedback avalanche diodes

Boris Korzh·Tommaso Lunghi·Kateryna Kuzmenko·Gianluca Boso·Hugo Zbinden
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Abstract

We characterize the temporal evolution of the afterpulse probability in a free-running negative feedback avalanche diode (NFAD) over an extended range, from $\sim$300 ns to $\sim$1 ms. This is possible thanks to an extremely low dark count rate on the order of 1 cps at 10% efficiency, achieved by operating the NFAD at a temperatures as low as 143 K. Experimental results in a large range of operating temperatures (223-143 K) are compared with a legacy afterpulsing model based on multiple trap families at discrete energy levels, which is found to be lacking in physical completeness. Subsequently, we expand on a recent proposal which considers a continuous spectrum of traps by introducing well defined edges to the spectrum, which are experimentally observed.

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Boris Korzh, Tommaso Lunghi, Kateryna Kuzmenko, Gianluca Boso, Hugo Zbinden. 2014-11-03. Afterpulsing studies of low noise InGaAs/InP single-photon negative feedback avalanche diodes. https://arxiv.org/abs/1411.0653

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