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arXiv · 1501.07633

Direct-write milling of diamond by a focused oxygen ion beam

Aiden A. Martin·Steven Randolph·Aurelien Botman·Milos Toth·Igor Aharonovich
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Abstract

Recent advances in focused ion beam technology have enabled high-resolution, direct-write nanofabrication using light ions. Studies with light ions to date have, however, focused on milling of materials where sub-surface ion beam damage does not inhibit device performance. Here we report on direct-write milling of single crystal diamond using a focused beam of oxygen ions. Material quality is assessed by Raman and luminescence analysis, and reveals that the damage layer generated by oxygen ions can be removed by nonintrusive post-processing methods such as localised electron beam induced chemical etching.

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Aiden A. Martin, Steven Randolph, Aurelien Botman, Milos Toth, Igor Aharonovich. 2015-01-29. Direct-write milling of diamond by a focused oxygen ion beam. https://arxiv.org/abs/1501.07633

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