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arXiv · 1512.03208

Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level

Christophe Fluhr·Serge Grop·Benoît Dubois·Yann Kersalé·Enrico Rubiola·Vincent Giordano
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Abstract

We present the characterisation of three Cryogenic Sapphire Oscillators using the three-corner-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyse the frequency stability limitations of these state-of-the-art ultra-stable oscillators. The best unit presents a fractional frequency stability better than 5e-16 at 1 s and below 2e-16 for integration times less than 5,000s.

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Christophe Fluhr, Serge Grop, Benoît Dubois, Yann Kersalé, Enrico Rubiola, Vincent Giordano. 2015-12-10. Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level. https://arxiv.org/abs/1512.03208

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