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arXiv · 1601.07431

Diffraction grating characterisation for cold-atom experiments

James P. McGilligan·Paul F. Griffin·Erling Riis·Aidan S. Arnold
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Abstract

We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.

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James P. McGilligan, Paul F. Griffin, Erling Riis, Aidan S. Arnold. 2016-01-27. Diffraction grating characterisation for cold-atom experiments. https://doi.org/10.1364/josab.33.001271

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