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arXiv · 1611.09712

A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors

A. Phipps·A. Juillard·B. Sadoulet·B. Serfass·Y. Jin
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Abstract

We present the measured baseline ionization resolution of a HEMT-based cryogenic charge amplifier coupled to a CDMS-II detector. The amplifier has been developed to allow massive semiconductor dark matter detectors to retain background discrimination at the low recoil energies produced by low-mass WIMPs. We find a calibrated baseline ionization resolution of $σ_E = 91\,\text{eV}_{ee}$. To our knowledge, this is the best direct ionization resolution achieved with such massive ($\approx$150 pF capacitance) radiation detectors.

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A. Phipps, A. Juillard, B. Sadoulet, B. Serfass, Y. Jin. 2019-06-19. A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors. https://doi.org/10.1016/j.nima.2019.06.022

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