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arXiv · 1702.02071

Contact-less characterizations of encapsulated graphene p-n junctions

V. Ranjan·S. Zihlmann·P. Makk·K. Watanabe·T. Taniguchi·C. Schönenberger
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Abstract

Accessing intrinsic properties of a graphene device can be hindered by the influence of contact electrodes. Here, we capacitively couple graphene devices to superconducting resonant circuits and observe clear changes in the resonance- frequency and -widths originating from the internal charge dynamics of graphene. This allows us to extract the density of states and charge relaxation resistance in graphene p-n junctions without the need of electrical contacts. The presented characterizations pave a fast, sensitive and non-invasive measurement of graphene nanocircuits.

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V. Ranjan, S. Zihlmann, P. Makk, K. Watanabe, T. Taniguchi, C. Schönenberger. 2017-02-07. Contact-less characterizations of encapsulated graphene p-n junctions. https://doi.org/10.1103/physrevapplied.7.054015

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