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arXiv · 1702.05180

Test of UFSD Silicon Detectors for the TOTEM Upgrade Project

R. Arcidiacono·M. Berretti·E. Bossini·M. Bozzo·N. Cartiglia·M. Ferrero·V. Georgiev·T. Isidori·R. Linhart·N. Minafra·M. M. Obertino·V. Sola·N. Turini
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Abstract

This paper describes the performance of a prototype timing detector, based on 50 micrometer thick Ultra Fast Silicon Detector, as measured in a beam test using a 180 GeV/c momentum pion beam. The dependence of the time precision on the pixel capacitance and the bias voltage is investigated here. A timing precision from 30 ps to 100 ps, depending on the pixel capacitance, has been measured at a bias voltage of 180 V. Timing precision has also been measured as a function of the bias voltage.

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R. Arcidiacono, M. Berretti, E. Bossini, M. Bozzo, N. Cartiglia, M. Ferrero, V. Georgiev, T. Isidori, R. Linhart, N. Minafra, M. M. Obertino, V. Sola, N. Turini. 2017-02-16. Test of UFSD Silicon Detectors for the TOTEM Upgrade Project. https://arxiv.org/abs/1702.05180

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