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arXiv · 1705.08958

Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source

E. M. Boulton·E. Bernard·N. Destefano·B. N. V. Edwards·M. Gai·S. A. Hertel·M. Horn·N. A. Larsen·B. P. Tennyson·C. Wahl·D. N. McKinsey
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Abstract

We calibrate a two-phase xenon detector at 0.27 keV in the charge channel and at 2.8 keV in both the light and charge channels using a $^{37}$Ar source that is directly released into the detector. We map the light and charge yields as a function of electric drift field. For the 2.8 keV peak, we calculate the Thomas-Imel box parameter for recombination and determine its dependence on drift field. For the same peak, we achieve an energy resolution, $E_{\sigma}/E_{mean}$, between 9.8% and 10.8% for 0.1 kV/cm to 2 kV/cm electric drift fields.

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E. M. Boulton, E. Bernard, N. Destefano, B. N. V. Edwards, M. Gai, S. A. Hertel, M. Horn, N. A. Larsen, B. P. Tennyson, C. Wahl, D. N. McKinsey. 2017-05-24. Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source. https://doi.org/10.1088/1748-0221%2F12%2F08%2Fp08004

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