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arXiv · 1801.01706

Non-Invasive Imaging Method of Microwave Near Field Based on Solid State Quantum Sensing

Bo Yang·Guanxiang Du·Yue Dong·Guoquan Liu·Zhenzhong Hu·Yongjin Wang
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Abstract

In this paper, we propose a non-invasive imaging method of microwave near field using a diamond containing nitrogen-vacancy centers. We applied synchronous pulsed sequence combined with charge coupled device camera to measure the amplitude of the microwave magnetic field. A full reconstruction formulation of the local field vector, including the amplitude and phase, is developed by measuring both left and right circular polarizations along the four nitrogen-vacancy axes. Compared to the raster scanning approach, the two dimensional imaging method is promising for application to circuit failure analysis. A diamond film with micrometer thinness enables high-resolution near field imaging. The proposed method is expected to have applications in monolithic-microwave-integrated circuit chip local diagnosis, antenna characterization, and field mode imaging of microwave cavities and waveguides.

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Bo Yang, Guanxiang Du, Yue Dong, Guoquan Liu, Zhenzhong Hu, Yongjin Wang. 2018-01-05. Non-Invasive Imaging Method of Microwave Near Field Based on Solid State Quantum Sensing. https://doi.org/10.1109/tmtt.2018.2812204

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