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arXiv · 1810.01962

Dielectric Properties of Conductively Loaded Polyimides in the Far Infrared

Kyle R. Helson·Kevin H. Miller Karwan Rostem·Manuel Quijada·Edward J. Wollack
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Abstract

The dielectric properties of selected conductively-loaded polyimide samples are characterized in microwave through far infrared wavebands. These materials, belonging to the Vespel\textsuperscript{\textregistered} family, are more readily formed by direct machining than their ceramic loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600\,${\rm cm^{-1}}$ (0.03 to 18\,THz) were preformed and used in parametrization of the media's dielectric function at frequencies below $\approx3\,$THz.

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Kyle R. Helson, Kevin H. Miller Karwan Rostem, Manuel Quijada, Edward J. Wollack. 2018-10-11. Dielectric Properties of Conductively Loaded Polyimides in the Far Infrared. https://doi.org/10.1364/ol.43.005303

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