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arXiv · 1911.00396

Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals

Sergio L. Morelhao·Stefan Kycia·Samuel Netzke·Celso I. Fornari·Paulo H. O. Rappl·Eduardo Abramof
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Abstract

In the supporting information file for article Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators(J. Phys. Chem. C 2019, 123, 24818-24825, doi: 10.1021/acs.jpcc.9b05377), several topics on X-ray diffraction analysis of thin films were developed or revisited. A simple equation to determine lateral lattice coherence lengths in thin films stands as the main development (section S4 - Lateral lattice coherence length in thin films), while X-ray dynamical diffraction simulation in monochromator crystals stands as an interesting overview on how the ratio between $\pi$ and $\sigma$ polarization components is affected by whether diffraction takes place under kinematical or dynamical regime (section S3 - Polarization factor).

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Sergio L. Morelhao, Stefan Kycia, Samuel Netzke, Celso I. Fornari, Paulo H. O. Rappl, Eduardo Abramof. 2019-11-01. Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals. https://arxiv.org/abs/1911.00396

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