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arXiv · 2008.11425

Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors

Emmanuel Fokitis·Theodoros Geralis·Stavros Maltezos·Nikolaos Vodinas
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Abstract

A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray tube, were at the range 200 - 400 MHz, while an uncertainty in the flux of the order of 5% has been estimated. We also applied this calibration for radiation hardness study of a multichannel silicon microstrip X-Ray detector.

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Emmanuel Fokitis, Theodoros Geralis, Stavros Maltezos, Nikolaos Vodinas. 2020-08-26. Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors. https://arxiv.org/abs/2008.11425

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