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arXiv · 2102.00965

Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Kyle S. McKay·Dustin A. Hite·Philip D. Kent·Shlomi Kotler·Dietrich Leibfried·Daniel H. Slichter·Andrew C. Wilson·David P. Pappas
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Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

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Kyle S. McKay, Dustin A. Hite, Philip D. Kent, Shlomi Kotler, Dietrich Leibfried, Daniel H. Slichter, Andrew C. Wilson, David P. Pappas. 2021-02-01. Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor. https://doi.org/10.1103/physreva.104.052610

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