arXiv · 2207.05818
High-precision mass measurement of $^{24}$Si and a refined determination of the $rp$ process at the $A=22$ waiting point
Abstract
We report a high precision mass measurement of $^{24}{\rm Si}$, performed with the LEBIT facility at the National Superconducting Cyclotron Laboratory. The atomic mass excess, $10\;753.8$(37) keV, is a factor of 5 more precise than previous results. This substantially reduces the uncertainty of the $^{23}{\rm Al}(p,\gamma)^{24}{\rm Si}$ reaction rate, which is a key part of the rapid proton capture ($rp$) process powering Type I X-ray bursts. The updated rate constrains the onset temperature of the $(\alpha,p)$ process at the $^{22}{\rm Mg}$ waiting-point to a precision of 9%.
Explore related subjects
Keep this discovery
D. Puentes, Z. Meisel, G. Bollen, A. Hamaker, C. Langer, E. Leistenschneider, C. Nicoloff, W. -J. Ong, M. Redshaw, R. Ringle, C. S. Sumithrarachchi, J. Surbrook, A. A. Valverde, I. T. Yandow. 2022-07-12. High-precision mass measurement of $^{24}$Si and a refined determination of the $rp$ process at the $A=22$ waiting point. https://doi.org/10.1103/physrevc.106.l012801
Cite the original work for its findings. Save a collection to share your selection of sources.